Semiconductor packaging method and semiconductor packaging structure

A packaging method and packaging structure technology, which is applied in semiconductor devices, semiconductor/solid-state device manufacturing, semiconductor/solid-state device components, etc., can solve problems such as poor bonding force, affecting product reliability, and different lattice constants, and achieve simplification Semiconductor package structure, reduction of risk of peeling, effect of time reduction

Active Publication Date: 2020-10-02
SIPLP MICROELECTRONICS CHONGQING CO LTD
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the materials of the metal heat dissipation layer and the chip and the encapsulation layer are different, and the lattice constants of different materials are different, resulting in poor bonding between the chip and the encapsulation layer and the metal heat dissipation layer, and the metal heat dissipation layer and the chip and the encapsulation layer may be Delamination will occur, affecting the reliability of the product

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor packaging method and semiconductor packaging structure
  • Semiconductor packaging method and semiconductor packaging structure
  • Semiconductor packaging method and semiconductor packaging structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0051] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present application. Rather, they are merely examples of apparatuses and methods consistent with aspects of the present application as recited in the appended claims.

[0052]The terminology used in this application is for the purpose of describing particular embodiments only, and is not intended to limit the application. As used in this application and the appended claims, the singular forms "a", "the", and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise. It should also be understood that the term "...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a semiconductor packaging method and a semiconductor packaging structure. The semiconductor packaging method comprises the steps that at least one to-be-packaged chip and an auxiliary member are mounted on a carrier plate, wherein the auxiliary member comprises auxiliary structures in one-to-one correspondence with the chips, the auxiliary structure comprises an auxiliary part arranged on the peripheral side of the chip, the chip comprises a first surface and a second surface opposite to the first surface, the first surface is provided with a plurality of welding pads, and the first surface of the chip faces the carrier plate, the auxiliary part comprises a third surface and a fourth surface opposite to the third surface, the third surface faces the carrier plate, and a gap exists between the third surface and the carrier plate; an encapsulation layer is formed, the encapsulation layer covers the carrier plate and encapsulates the at least one to-be-packaged chipand the auxiliary part, the second surface and the fourth surface are exposed out of the encapsulation layer, and the third surface is covered by the encapsulation layer; a heat dissipation layer isformed on one side of the first surface, wherein the heat dissipation layer covers the chip and the auxiliary structure; the material of the heat dissipation layer and the material of the auxiliary structure are both metal.

Description

technical field [0001] The present application relates to the field of semiconductor technology, in particular to a semiconductor packaging method and a semiconductor packaging structure. Background technique [0002] Common semiconductor packaging technology, such as chip packaging technology, mainly includes the following process: first, the front of the chip is bonded to the carrier board with adhesive tape, heat-pressed and molded, the carrier board is peeled off, and then a rewiring structure is formed on the front side of the chip, and for encapsulation. [0003] In order to improve the heat dissipation performance of the chip, a metal heat dissipation layer is usually formed on the back of the chip during the packaging process. However, the materials of the metal heat dissipation layer and the chip and the encapsulation layer are different, and the lattice constants of different materials are different, resulting in poor bonding between the chip and the encapsulation...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/48H01L21/56H01L23/16H01L23/31H01L23/373
CPCH01L21/4882H01L21/56H01L23/3736H01L23/3735H01L23/16H01L23/3114
Inventor 霍炎涂旭峰
Owner SIPLP MICROELECTRONICS CHONGQING CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products