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Electric card performance test system

A test system and performance technology, applied in environmental/reliability testing, measuring electricity, measuring devices, etc., can solve the problem of low accuracy of test results, achieve accurate and reliable collection of electrical card signals, reduce heat exchange process, and shield interference Effect

Active Publication Date: 2020-10-30
TONGJI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a kind of electronic card performance test system in order to overcome the above-mentioned defects existing in the prior art, specifically a kind of variable temperature, high vacuum, high accuracy and little heat exchange direct method precision test system for electric card performance. To solve the problem of low accuracy of test results due to the heat exchange between the sample to be tested and the test environment during the performance test of the existing electric card

Method used

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Experimental program
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Effect test

Embodiment 1

[0036] Such as figure 1 The shown electrical card performance testing system includes three subsystems: data acquisition subsystem, high voltage output subsystem, variable temperature vacuum minimal heat exchange subsystem; wherein, the data acquisition subsystem consists of computer 3, communication line 4, digital The multimeter 6 and the temperature measuring thermal resistance 10 are electrically connected in turn, and the communication line 4 is a GPIB communication line. The temperature measuring thermal resistance 10 is a PT100 thermal resistance and is connected to the digital multimeter 6 by a four-wire connection. The digital multimeter 6 can be used in real time. Collect the resistance of PT100 thermal resistance, and convert it into temperature data according to the relationship between PT100 resistance and temperature. Computer 3 can control digital multimeter 6 to continuously collect the precise temperature of PT100 through communication line 4 in real time, so a...

Embodiment 2

[0043] Such as figure 1 An electric card performance testing system shown includes a temperature-controlled closed box for placing the test sample 11, a temperature measurement unit connected to the test sample 11 and a high-voltage adjustment unit, and a temperature-controlled closed box. through the vacuum unit;

[0044] Wherein, a heat-insulating sample fixture 9 is provided between the high-voltage regulating unit and the sample 11 to be tested, and the high-voltage regulating unit includes an electrode 14 and a high-voltage source 2 that are electrically connected to the heat-insulating sample fixture 9 in turn, and the high-voltage source 2 can be started and stopped by pressing a button. The method realizes the square wave signal switching of the test electric field and the zero electric field, and the electrode 14 is an electrode rod.

[0045] The thermal insulation sample fixture 9 is a silver wire clamp, which is composed of two thin silver wires electrically connec...

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PUM

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Abstract

The invention relates to an electric card performance test system. The electric card performance test system comprises a temperature control closed box body, a temperature measurement unit, a high-voltage regulation unit, and a vacuum unit, wherein the temperature control closed box body is used for placing a to-be-tested sample, the temperature measurement unit and the high-voltage regulation unit are connected with the to-be-tested sample, and the vacuum unit are communicated with the temperature control closed box body; a thermal insulation sample clamp is arranged between the high-voltageregulation unit and the to-be-tested sample. According to the electric card performance test system of the invention, the to-be-tested sample is suspended in the vacuum environment through the thermalinsulation sample clamp; an approximately adiabatic test environment is provided; the heat exchange process is greatly reduced; an ideal minimal heat exchange environment is provided for a data acquisition subsystem to sensitively and accurately acquire the temperature change of the electric card sample, so that a test result is more accurate. The test system is low in cost, variable in temperature, convenient to operate and stable in test signal, and is beneficial to promoting the research and application process of an electric card refrigeration material.

Description

technical field [0001] The invention belongs to the technical field of material testing and relates to an electric card performance testing system. Background technique [0002] Traditional gas compression refrigeration methods use organic gases as refrigerants, and the released greenhouse gases will directly cause serious damage to the ozone layer. Energy issues in today's world are becoming more and more prominent, and environmental protection is increasingly valued. New economical and environmentally friendly refrigeration methods are developed to replace traditional gas compression technology. become an important research topic. At present, the refrigeration methods with development potential include electric card refrigeration, magnetic card refrigeration, thermoelectric cooler, etc. Among them, magnetic card refrigeration and thermoelectric cooler are bulky and inefficient, and electric card refrigeration materials are more efficient and flexible. The new solid-state ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/20G01R31/00
CPCG01N25/20G01R31/003
Inventor 沈波李国辉翟继卫
Owner TONGJI UNIV