Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

System acceleration verification test method based on fuzzy analytic hierarchy process

A fuzzy level and verification test technology, applied in reliability/availability analysis, instrumentation, electrical digital data processing, etc., can solve the problems of long test time, short cycle and low cost requirements, large test sample size, etc.

Active Publication Date: 2020-11-17
TECH & ENG CENT FOR SPACE UTILIZATION CHINESE ACAD OF SCI
View PDF3 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The existing RADT design theories and methods are gradually being enriched and improved, but generally have the problems of large sample size and long test time for reliability verification tests, which make it difficult to meet the short-cycle and low-cost requirements of today's high-reliability and long-life electronic product development

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System acceleration verification test method based on fuzzy analytic hierarchy process
  • System acceleration verification test method based on fuzzy analytic hierarchy process
  • System acceleration verification test method based on fuzzy analytic hierarchy process

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0088] In order to make the technical problems, technical solutions and beneficial effects solved by the present invention, the present invention will be described in further detail below with reference to the accompanying drawings and examples. It will be appreciated that the specific embodiments described herein are intended to explain the invention and is not intended to limit the invention.

[0089] Based on the traditional reliability verification test large sample statistical methods, test long time, is now difficult to meet the high reliability and long life of electronic product development of short cycle and low cost requirements. The present invention is a "physical fault STATISTICS +" method, a system for multi-item multi-stress accelerated failure verification test methods. Based on the idea of ​​reliability index allocated by environmental stress, from the function, structure, mechanism, stress levels to determine the four key features, weaknesses, the main failure mode...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a system acceleration verification test method based on a fuzzy analytic hierarchy process. The method comprises the following steps: adopting the fuzzy analytic hierarchy process to decompose a to-be-verified system task reliability total index R from top to bottom according to four levels of function, structure, mechanism and stress, and determining the relationship between the total index R and each stress; distributing the weight of the total index R according to the stress type; obtaining the reliability of the total index R distributed according to the stress type;and determining an acceleration test profile, counting a test scheme and a total acceleration factor, and carrying out environment tests of different stress types on the system. The system acceleration verification test method based on the fuzzy analytic hierarchy process has the advantages that a mathematical statistics and fault physics method is adopted, the problem of complex system reliability index verification is solved through an environment test easy to carry out, the test time is short, the cost is low, the sample size is small, a test design method is provided, and the test efficiency is improved. Therefore, a test scheme can be quickly determined, and system reliability indexes are verified.

Description

Technical field [0001] The present invention belongs to the technical field demonstration test system acceleration, particularly to a system based on FAHP accelerated verification test methods. Background technique [0002] Reliability test (Reliability demonstration test, RDT) by methods of mathematical statistics validation failure rate, MTBF (mean time to failure, MTBF) and other life, reliability parameters are required, it is designed to allow the ordering party can get qualified products, while also understand Cheng Zhifang product life and reliability, the general condition of the true stress, the test time depends mainly on the level of reliability and statistical tests to be authenticated program selected in GJB899A-2009 "reliability Qualification and acceptance tests" are given in a variety of statistical tests to verify the reliability of the test program. In most aerospace and other engineering applications, system-level products typically adopt one by one single typi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F11/00G06F30/27G06F119/02G06F119/14
CPCG06F11/008G06F30/27G06F2119/02G06F2119/14Y02P90/30
Inventor 李鹏李桃秦泰春吕从民
Owner TECH & ENG CENT FOR SPACE UTILIZATION CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com