Grating projection three-dimensional measurement device and measurement method for high-reflection object curved surface

Abstract

The invention discloses a grating projection three-dimensional measurement device and a measurement method for a high-reflection object curved surface. Two groups of polarizers are respectively arranged in front of a projector and a CCD camera; a beam splitter is arranged in front of the polarizer located in front of the CCD camera, a plane mirror imaging system comprises a plane mirror and an imaging plate, and an object placing table is a two-degree-of-freedom swing arm and comprises a first stepping motor controlling the object placing table to rotate by 360 degrees in the horizontal direction and a second stepping motor controlling the object placing table to swing by 45 degrees front and back. According to the invention, the plane mirror imaging system is added in a system light path,and the light intensity of a high-reflection object is weakened once in the plane mirror imaging process; meanwhile, the polarizer is additionally arranged in front of the CCD camera and used for eliminating and filtering direct light in light beams, secondary weakening of the light intensity of a high-reflection object is achieved, light saturation of a CCD camera sensor is avoided at the moment, and object information is completely collected; the structure is simple, implementation is easy and price is low.

Description

Technical field [0001] The invention belongs to the field of grating projection three-dimensional measurement, and specifically relates to a grating projection three-dimensional measurement device and a measurement method for the curved surface of a highly reflective object. Background technique [0002] As a non-contact measurement method, three-dimensional measurement is widely used in the fields of biomedicine, cultural relics restoration, aerospace, and reverse engineering due to its non-contact, high accuracy, and fast speed. At present, the related non-contact measurement methods are mostly applied to the three-dimensional measurement and modeling of the surface of diffuse reflection objects. For the manufacturing industry, the measurement requirements for highly reflective objects are also increasing, such as the surface of optical components in the optical manufacturing field, and the surface repair of blades in the aerospace field. These highly reflective surfaces need t...

AI Technical Summary

Problems solved by technology

There is specular reflection in highly reflective objects. When the CCD camera collects data, the photosensitive sensor of the CCD camera is saturated due to specular reflection. The collected information here is lost, and the high reflective free-form surface cannot be completely reconstructed.

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