Method and device for evaluating test time and assembly state of photovoltaic assembly

Abstract

The invention discloses a photovoltaic module test time and a module state evaluation method and device. The method comprises steps of solving model parameters in a pre-constructed module power attenuation model according to the indoor damp-heat test, and obtaining the module temperature of the photovoltaic module and the relative humidity of the module surface corresponding to the target area according to the meteorological data of the target area of the outdoor application of the photovoltaic module; and calculating the power attenuation rate delta P target of the photovoltaic module under the set age limit of the target area and the test time required by the photovoltaic module when the power attenuation rate reaches the delta P target. The method is advantaged in that the test time required for the power attenuation rate to reach the power attenuation rate of the photovoltaic module after the set application time limit in the target area can be evaluated, therefore, an assembly state of the photovoltaic assembly after the photovoltaic assembly is used for a set period of time in a target area can be accurately evaluated according to the required test time, and data support is provided for reliability of the photovoltaic assembly.

Description

technical field [0001] The invention relates to the technical field of photovoltaics, in particular to a method and device for testing time and component state evaluation of photovoltaic components. Background technique [0002] At present, the testing and certification standards for the photovoltaic industry usually use IEC 61215 or IEC 61730 and UL1703 testing standards. In order to determine the ability of photovoltaic modules to withstand long-term humid and hot environments, conventional indoor damp heat accelerated aging tests are usually carried out according to the requirements of IEC 61215. The photovoltaic modules to be tested are placed in a humid heat environment test chamber, and indoor damp heat tests are carried out under pre-set test conditions. For example, for copper indium gallium selenide thin film components, the test conditions are usually set as follows: the set value of the test chamber temperature is: 85°C, the temperature of the test chamber should ...

AI Technical Summary

Problems solved by technology

[0003] The current indoor damp heat test method is generally applicable to the qualification test and certification of the quality of photovoltaic modules. The test time cannot correspond to the outdoor service life of photovoltaic modules, and it is impossible to accurately judge the performance of photovoltaic modules after the set period of outdoor use. Component status, test results cannot be used to determine the reliability of components

Images