A Multi-label Marking Method for Defect Reports
A defect reporting and marking method technology, applied in the computer field, can solve the problems of not being able to meet the requirements of multi-label data, not enough labels, etc., and achieve the effect of efficient multi-label prediction and improving work speed.
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[0103] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are For some embodiments of the present invention, those skilled in the art can also obtain other drawings based on these drawings without creative work.
[0104] figure 1 It is a flow chart of the method of the present invention. Combine below Figure 1 to Figure 4 The specific embodiment of the present invention is introduced as a multi-label marking method for defect reports, including the following steps:
[0105] Step 1: Construct a defect report data set, construct a user-specified candidate label set according to the defect report data set, construct an initial multi-label training data set according to the user-specified candidate label set, and perfo...
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