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A Multi-label Marking Method for Defect Reports

A defect reporting and marking method technology, applied in the computer field, can solve the problems of not being able to meet the requirements of multi-label data, not enough labels, etc., and achieve the effect of efficient multi-label prediction and improving work speed.

Active Publication Date: 2021-11-16
WUHAN UNIV
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  • Application Information

AI Technical Summary

Problems solved by technology

However, if you want to add labels to defect reports from cross-warehouses, how to filter and unify labels is a problem that label classification will encounter
The existing single-label methods have some work in the unification of labels, but the types of unified labels are not enough to meet the data requirements of multi-label

Method used

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  • A Multi-label Marking Method for Defect Reports
  • A Multi-label Marking Method for Defect Reports
  • A Multi-label Marking Method for Defect Reports

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Embodiment Construction

[0103] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are For some embodiments of the present invention, those skilled in the art can also obtain other drawings based on these drawings without creative work.

[0104] figure 1 It is a flow chart of the method of the present invention. Combine below Figure 1 to Figure 4 The specific embodiment of the present invention is introduced as a multi-label marking method for defect reports, including the following steps:

[0105] Step 1: Construct a defect report data set, construct a user-specified candidate label set according to the defect report data set, construct an initial multi-label training data set according to the user-specified candidate label set, and perfo...

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Abstract

The invention provides a multi-label marking method for defect reports. In the present invention, the user specifies a set of labels to be selected, constructs an initial multi-label training data set according to the set, performs the first round of label completion through a manual completion method to obtain a multi-label training data set after the first round of completion, and uses binary classification The prediction method automatically completes the second round of label completion to obtain the multi-label training data set after the second round of completion, and then performs the third round of label completion through the manual completion method to obtain the final multi-label training data set; build a fast text classifier based on The text multi-category classification model of the algorithm is trained based on the final multi-label training data set, and the trained text multi-classification model is used as the post-training defect report label predictor; use the post-training defect report label predictor to perform multi-label labeling for defect reports , and collect user feedback to update prediction performance on the fly. The present invention provides a method for efficiently predicting and labeling multiple labels for defect reports.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a multi-label marking method for defect reports. Background technique [0002] Defect reports play an important role in software development. The increasingly mature defect tracking system, along with the continuous improvement of defect report management capabilities, also provides more convenient defect report sorting services for modern software development. For example, GitHub, an all-in-one coding community, has integrated a Git-based version control system with a lightweight defect tracking system to provide convenient coding services. This bug report tracking system helps to log thousands of bug reports for many open source projects. [0003] A very important function of a bug report tracking system is to assign tags to bug reports. The tags of defect reports help developers to quickly classify or identify defect reports. [0004] In real projects, defect reports ofte...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06K9/62
CPCG06F11/3692G06F18/214
Inventor 谢晓园陈崧强苏宇辉晋硕姬渊翔
Owner WUHAN UNIV
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