Point light source scanning illumination method and detection device

Abstract

The invention relates to a point light source scanning illumination method and a detection device, and the method achieves the multi-angle illumination through employing an XYZ precision displacementplatform to control the same point light source for scanning, and different illumination modes with the known space coordinates can be arranged. And the spatial coordinates determined in advance is applied to a Fourier lamination reconstruction algorithm so as to improve the reconstruction resolution. The detection device is composed of a CCD camera, a tube lens, a microscope objective, a point light source, an XYZ precision displacement table and a computer. On the basis of the Fourier laminated microscopic imaging technology, the problem of poor reconstruction quality caused by inconsistentlight intensity of point light source illumination samples and spatial coordinate position errors of an LED light source can be solved, comparative optimization of multiple illumination modes is easyto realize, the illumination mode is more flexible, and the applicability of the system is improved.

Description

technical field [0001] The invention relates to the technical field of optical microscopic imaging, in particular to a point light source scanning illumination method and a detection device. Background technique [0002] Fourier stack imaging (FPM) is a computational imaging method applied in the field of optical microscopic imaging. It effectively solves the problem of simultaneously achieving high resolution and wide field of view in traditional microscopic imaging systems. With the advantages of low system cost, high imaging resolution, and large imaging field of view, it has broad application prospects in many microscopic imaging fields such as medical imaging and biological science. [0003] The structure of the existing FPM system generally uses an LED array light source to illuminate the sample to be tested from multiple angles, but there are some defects in the LED array light source illumination. The luminous intensity of each LED light source in the LED array ligh...

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Problems solved by technology

[0005] In order to solve the technical problems existing in the above-mentioned background technology, the present invention provides a method with reasonable conception, based on Fourier stacked microscopic imaging technology, which can overcome the inconsistency of the light intensity of the sample illuminated by the point light source and the error of the spatial coordinate position of the LED light source. The problem of poor reconstruction quality, it is easy to realize the contrast optimization of multiple lighting modes, the lighting mode is more flexible, and the point light source scanning lighting method and detection device that improve the applicability of the system

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