High-frequency transient three-dimensional measurement system calibration device and method

Abstract

The invention discloses a high-frequency transient three-dimensional measurement system calibration device and method. The device comprises a calibration plate, a laser tracker, a synchronizer, a calibration plate light-emitting target controller and a high-frequency transient three-dimensional measurement system; the calibration board light-emitting target controller is used for controlling on-off of direction control points and light-emitting control points according to the synchronizing signals sent by the synchronizer, and the laser tracker is used for measuring three-dimensional coordinates of the laser tracker control points according to the synchronizing signals sent by the synchronizer; the high-frequency transient three-dimensional measurement system is used for measuring the plane coordinates of the light-emitting control points according to the synchronizing signals sent by the synchronizer. The method for calibrating the high-frequency transient three-dimensional measurement system is simple and accurate, the calibration plate is convenient to manufacture, low in cost and convenient to popularize, and the calibration plate can be directly applied to the field of calibration of high-frequency transient three-dimensional measurement instruments in aviation and aerospace test experiments.

Description

technical field [0001] The invention relates to the field of calibration of a line array camera in a photoelectric non-contact high-dynamic measurement system, in particular to a calibration device and method for a high-frequency transient three-dimensional measurement system Background technique [0002] In the photoelectric non-contact high dynamic measurement system, the line array image sensor has the characteristics of high frame rate and high resolution in one direction. Measuring the field of view, the measurement accuracy of the system can be improved under the same field of view. Therefore, it has become an important development direction in the field of high dynamic measurement to use three one-dimensional line array cameras combined with light-emitting targets to realize three-dimensional measurement technology under high-speed movement of the target. [0003] A high-frequency transient three-dimensional measurement system realized by three one-dimensional line a...

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a high-frequency transient three-dimensional measurement system calibration device and method to solve the problem of strict requirements on the moving direction and distance of the target or camera in the existing linear array calibration method

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