Reclaiming method and device

Abstract

The invention discloses a material retrieving method and device. The material retrieving method includes: obtaining information on the carrying workpiece of the carrying mechanism and the retrieving information of the retrieving mechanism; wherein, the information on the carrying workpiece includes position information and quantity information of the carrying workpiece. The material information includes enabling information of the reclaiming mechanism; matching the workpiece and the reclaiming mechanism according to the carrying workpiece information and the retrieving information to obtain matching information; and retrieving according to the matching information. It can effectively avoid the downtime of test equipment caused by factors such as no workpiece placed on the station on the carrier mechanism, damage to the station on the carrier mechanism, damage to the reclaiming unit in the reclaiming structure, and failure to activate the reclaiming unit in the reclaiming mechanism. , thereby reducing the equipment downtime caused by the reclaiming mechanism and carrying workpieces, and improving the reliability and operating efficiency of the testing equipment.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of testing, and in particular to a material retrieving method and device. Background technique [0002] During the testing process of chip packaging, it is necessary to pick up the chip placed in the tray and place it into the test cavity of the testing machine to realize the material picking process, and only then can the pins of the chip be connected to the circuit system of the testing machine and start test. [0003] With the continuous improvement of automation procedures in the field of chip packaging and testing, it is necessary to ensure the efficiency of retrieving materials. At present, most of the automatic retrieving mechanisms are a plurality of suction nozzles arranged in a matrix with equal row and column spacing. The retrieving method is to draw from the starting point of the tray in a fixed order, one group at a time, and then directly or indirectly The method put...

AI Technical Summary

Problems solved by technology

However, no measure can avoid the problem of test equipment downtime caused by nozzles and test cavities in the production process, and the greater the number of combinations of nozzles and cavities, the higher the probability of test equipment downtime, resulting in The reliability of the test equipment is low, while reducing the operating efficiency of the test equipment

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