A polarization-modulated Hartmann-Shack wavefront detection device

A polarization modulation and detection device technology, applied in measurement devices, measurement optics, optical radiation measurement, etc., can solve problems such as indistinguishability, reduced wavefront detection accuracy, failure, etc., achieve high signal-to-background ratio, and improve wavefront detection accuracy. Effect

Active Publication Date: 2022-07-19
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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Problems solved by technology

When the signal-to-background ratio of the target detection is low or the background stray light is strong, the imaging information of the point source target or the extended target in the sub-aperture of the Hartmann-Shack sensor microlens array will be submerged, and the contrast will be greatly reduced. Since the traditional centroid algorithm or cross-correlation algorithm effectively extracts the position offset of the imaging intensity information in a single sub-aperture, and leads to a decrease in the accuracy of wavefront detection or even failure
Therefore, the traditional Hartmann-Shack wavefront detection technology cannot be applied to wavefront detection under the condition of strong background stray light, and the application field and detection ability are greatly limited
Subtracting the fixed threshold (Jiang Wenhan et al., the detection error of the Shaker-Hartmann wavefront sensor [J]. Acta Quantum Electronics, 02:218, 1998), narrow-band spectral filtering (J.Beckers et al., Using laser beacons for daytimeadaptive optics[J].Experimental Astronomy,11(2):133,2001), field of view offset (C.Li et al.,Field of view shifted Shack-Hartmann wavefront sensor for daytimeadaptive optics system[J].Optics Letters, 31(19):2821,2006) and other methods can improve the signal-to-background ratio of wavefront detection to a certain extent, but they still cannot realize the application scenarios of strong background stray light wavefront detection.
[0003] The root of the above problems lies in the traditional Hartmann-Shack wavefront detection technology, whose wavefront error information extraction stays in the intensity dimension, and the target signal light is integrated with the background stray light, although it can be weakened to a certain extent by reducing the fixed threshold and other means. The influence of background stray light, but it is impossible to fundamentally distinguish the two

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  • A polarization-modulated Hartmann-Shack wavefront detection device
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  • A polarization-modulated Hartmann-Shack wavefront detection device

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Embodiment Construction

[0037] The present invention is further described below in conjunction with the accompanying drawings and specific examples.

[0038] like figure 1 As shown, a polarization modulation Hartmann-Shack wavefront detection device is composed of a wave plate 1 , a wave plate rotating mechanism 2 , an analyzer 3 , a microlens array 4 , a light intensity detector 5 , and a data processor 6 . The incident light including the target light and background stray light enters the polarization modulator composed of the wave plate 1 and the analyzer 3 to modulate the polarization state of the incident light; the incident light after polarization modulation continues to propagate forward, And enter the microlens array 4, and is divided into M×N sub-areas, each sub-area is a micro-lens, which images the divided incident light on the photosensitive surface of the light intensity detector 5, and obtains the corresponding sub-area. Image intensity distribution. The wave plate 1 is installed on ...

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Abstract

The invention discloses a polarization modulation Hartmann-Shack wavefront detection device, which utilizes the difference in polarization characteristics between the wavefront detection target light and background stray light, and adds a rotatable wave plate and an analyzer in front of a microlens array, Perform polarization modulation on the incident beam to obtain the intensity distribution array under different polarization modulation states, and use the polarization restoration method to obtain the beam polarization information of the corresponding area of ​​a single microlens. front detection. Compared with the traditional Hartmann-Shack wavefront detection device, the patent of the present invention transforms the wavefront detection from the intensity detection dimension to the polarization detection dimension, and separates the target light from the background stray light by using the difference in the polarization characteristics of the target light and the background stray light. , greatly improving the signal-to-background ratio and realizing wavefront detection under strong background. The invention is particularly suitable for the application field of wavefront detection under strong background conditions, expands the application range, improves the detection capability, and has a simple structure.

Description

technical field [0001] The invention belongs to the technical field of wavefront aberration measurement, in particular to a polarization modulation Hartmann-Shack wavefront detection device. Background technique [0002] Hartmann-Shack wavefront detection technology is a general classical wavefront phase detection technology, which is widely used in adaptive optics, astronomy, optical detection, biomedicine and other important fields. When the background stray light is not strong, the Hartmann-Shack wavefront detection technology can be applied not only to point source target detection, but also to extended target detection. When the signal-to-background ratio of the target detection is low or the background stray light is strong, the imaging information of the point source target or extended target in the sub-aperture of the Hartmann-Shack sensor microlens array will be submerged, and the contrast will be greatly reduced. Since then, the traditional centroid algorithm or c...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J9/00
CPCG01J9/00G01J2009/002
Inventor 顾乃庭郭庭黄林海饶长辉
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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