X-ray emission low-temperature fluorescence detection system and method

Abstract

The invention relates to the field of X-rays, in particular to an X-ray emission low-temperature fluorescence detection system and method. The system comprises a workbench, and a ray emission adjusting device and a low-temperature fluorescence detection device which are fixed on the workbench; the output end of the ray emission adjusting device is aligned with a sample, and the output end of the ray emission adjusting device and the input end of a ray receiving device are positioned on the same diffractometer circumference; the low-temperature fluorescence detection device is fixed on the workbench, and the output end of the low-temperature fluorescence detection device is connected with the sample; the ray emission adjusting device is used for outputting X rays at different positions on the diffractometer circumference; the low-temperature fluorescence detection device is used for detecting and receiving fluorescence generated after the sample is excited by X-rays; according to the component, the accumulated error during sample alignment is reduced by arranging the ray emission adjusting device, and precise alignment of X-rays and a sample detection part is ensured; by arranging the low-temperature fluorescence detection device, the sample analysis efficiency is improved, and the quality of the detected sample is guaranteed.

Description

technical field [0001] The invention relates to the field of X-rays, in particular to an X-ray emitting low-temperature fluorescence detection system and method. Background technique [0002] X-ray detection is based on the principle of diffraction. When X-rays of known wavelengths (selecting characteristic X-rays with fixed wavelengths) are incident on a crystal plane with a lattice spacing of d at a Bragg angle, the X-rays that meet the Bragg conditions will be detected. Reflecting surfaces get diffraction lines enhanced by superposition. After the Bragg angle is measured, the lattice plane spacing, unit cell size and unit cell type can be determined by using the Bragg formula, so as to perform phase analysis and qualitative analysis on the sample. [0003] Chinese invention patent application (publication number CN102435626A, publication date: 20120502) discloses a desktop X-ray diffractometer, including an X-ray generator, a goniometer, a high-voltage switching power su...

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Problems solved by technology

[0004] The prior art has the following deficiencies: 1. When aligning the X-ray detection position, first position the sample; then manually use the bottom surface of the positioning mold end to contact the output end of the ray emitting mechanism for positioning, and adjust the collimator so that it is in line with The initial end of the positioning mold is aligned to complete the X-ray detection position alignment process; the positioning mold itself has a certain manufacturing error, and a certain positioning error will occur when using the bottom surface of the positioning mold end as the positioning reference; and adjust the collimator and the positioning mold When the initial end is aligned, it is adjusted by the scale of the human eye, and the scale of the human eye is less accurate than the X-ray detection scale, that is, adjusting the collimator by the human eye will also produce a large difference in the X-ray detection field. Observation error; the superposition of the positioning error generated by the positioning mold itself and the observation error generated by the human eye adjusting the collimator will cause a large cumulative error when the X-ray is aligned with the sample detection site, which is not conducive to the accuracy of the X-ray and sample detection site alignment

2. When performing X-ray diffraction analysis on the sample to determine the spatial arrangement of atoms and fluorescence analysis to determine the type and content of elements, install the sample to the diffraction analysis equipment and fluorescence analysis equipment for detection and analysis to complete the two analysis processes of the sample ; and when the diffraction analysis equipment and the fluorescence analysis equipment are separately detected, the sample positioning needs to be performed twice in the two devices, which increases the number of sample positioning and reduces the analysis efficiency of the sample; at the same time, the diffraction analysis of the sample The equipment and fluorescence analysis are carried out at normal temperature, and the X-ray irradiation of the sample at normal temperature is easy to cause damage to the surface of the sample; when X-ray diffraction analysis is required on multiple parts of the sample, it will cause damage to the sample. The surface of the sample will cause a large area of ​​damage, which is not conducive to ensuring the quality of the sample after testing.

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