Bad optical device capacitor element electric leakage test system and test method based on device end

Abstract

The invention provides a device end-based bad optical device capacitor element electric leakage test system, which comprises a voltmeter (3), an ammeter (7), a variable resistor set and a receiving optical device, wherein one end of the ammeter and one end of the voltmeter are grounded, the other end of the ammeter is connected with the variable resistor set, and the other end of the variable resistor set is connected with the receiving optical device; the receiving optical device comprises a VCC capacitor (2), a transimpedance amplifier (1), an RSSI capacitor (10) and a detector (4) which are connected in series, wherein one end of the RSSI capacitor is connected with the variable resistor set, one end of the VCC capacitor is grounded, the other end of the VCC capacitor is connected with the transimpedance amplifier and a voltmeter, and one end of the detector is connected with the transimpedance amplifier; the variable resistor set is a series or parallel circuit formed by resistors, the resistance of the variable resistor set is adjustable, and whether capacitance failure occurs in the receiving optical device or not is judged by adjusting changes of voltage values and current values according to different requirements of different products for matched resistors. The invention also discloses a corresponding test method.

Description

technical field [0001] The invention relates to the field of semiconductor testing, in particular to a leakage testing system and testing method for defective optical device capacitor elements based on the device side. Background technique [0002] With the rapid development of the Internet, big data, artificial intelligence, and high-definition television, the demand for optical fiber network transmission rates is getting higher and higher. Humans use various methods to increase chip transmission rates. With the increase in chip rates, the performance and The process requirements are getting higher and higher, and the process requirements in the product production process are relatively strict, especially in terms of ESD and EOS protection. If relevant measures are not taken well, it is easy to cause damage to chips or components during the production process. Such as figure 1 As shown, the existing test capacitor adopts the direct test method to implement the capacitance ...

AI Technical Summary

Problems solved by technology

[0003] 1. The existing scheme for testing capacitors is a test scheme for a single independent capacitor. By charging and discharging the capacitor for direct performance testing, only a single capacitor in an independent state can be tested. It is a direct way to test the capacitor. When the capacitor is assembled with other components Together, existing solutions cannot be tested;

[0004] 2. Optical devices are finished components that have been packaged with capacitors and other chips. At present, there is no way to test defective capacitors at the optical device end, resulting in defective products flowing out to the client, causing customer complaints, and increasing the analysis of defective products by technicians. time and effort, heavily impacting future orders

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