Intersection point-based Scheimpflug imaging system calibrating device and method
A technology of an imaging system and a calibration device, which is applied in the field of measurement, can solve the problems of difficulty in manufacturing spherical contours, large manufacturing errors, and reduce the measurement accuracy of a sham imaging system, and achieves great adaptability and flexibility, low production cost, and good versatility. Effect
Inactive Publication Date: 2021-04-27
上海交通大学烟台信息技术研究院 +1
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However, the existing displacement calibration methods all use a spherical calibration object, using the center of the sphere as a spatial point for calibration, but the manufacturing of the spherical contour is difficult, and manufacturing errors will be directly introduced into the calibration process, and the measurement of the center of the circle at different positions Errors will also directly produce calibration errors, thereby reducing the measurement accuracy of the Sham imaging system
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[0046] The following describes several preferred embodiments of the present invention with reference to the accompanying drawings to make the technical content clearer and easier to understand. The present invention can be embodied in many different forms of embodiments, and the protection scope of the present invention is not limited to the embodiments mentioned herein.
[0047] In the drawings, components with the same structure are denoted by the same numerals, and components with similar structures or functions are denoted by similar numerals. The size and thickness of each component shown in the drawings are shown arbitrarily, and the present invention does not limit the size and thickness of each component. In order to make the illustration clearer, the thickness of parts is appropriately exaggerated in some places in the drawings.
[0048] Such as figure 1 , figure 2 As shown, it is a schematic diagram of the composition of the Sham imaging system calibration device a...
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Abstract
The invention relates to an intersection point-based Scheimpflug imaging system calibrating device and method and belongs to the technical field of measurement. The calibrating device comprises a calibration object, a two-dimensional workbench, a Scheimpflug imaging system, a positioning mechanism and a computer; the calibration object is fixed on the two-dimensional workbench and can move along with the two-dimensional workbench; the Scheimpflug imaging system comprises a lens, a CCD device and a linear laser light source, and is located and fixed on the positioning mechanism; the calibration object is provided with two intersecting planes, and the intersecting line of the two intersecting planes is right opposite to the Scheimpflug imaging system; and the computer is connected to the two-dimensional workbench and the Scheimpflug imaging system. The calibration object is provided with two intersecting planes; the intersection point of straight lines formed by the line laser on the two planes is used as a space point; the displacement method is adopted to calibrate the Scheimpflug imaging system; and therefore, the calibrating device and method have the advantages of simplecalibration object, easiness in manufacture, high space point coordinate calculation precision, immunity of deformation influence and the like. The device and method are suitable for calibration of any type of Scheimpflug imaging system.
Description
technical field [0001] The invention relates to the field of measurement technology, in particular to a calibration device and method for a Sham imaging system based on intersection points. Background technique [0002] Contour measurement not only plays an important role in the industrial manufacturing process, but is also widely used in optical precision engineering, aerospace, robotics, chip manufacturing, automobile manufacturing, underwater detection and other fields, and has become a growing number of industrial applications. Function realization, equipment data acquisition, parts data acquisition, precision analysis, quality inspection and other essential links. [0003] With the increasing precision of manufacturing, non-contact contour measurement has gradually become the mainstream trend. Among them, the Sham imaging system based on the line structured light method has gradually become a hot spot. This method has outstanding advantages such as non-contact, high p...
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Login to View More IPC IPC(8): G01S7/40G01S13/89
CPCG01S7/40G01S13/89
Inventor 陶卫赵辉吕娜崔斌孙昊张振宁符钦伟
Owner 上海交通大学烟台信息技术研究院