Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Preparation method of light-emitting diode epitaxial wafer

A technology for light-emitting diodes and epitaxial wafers, which is applied in electrical components, circuits, semiconductor devices, etc., and can solve the problems of excessive electron migration and reducing the luminous efficiency of light-emitting diodes.

Pending Publication Date: 2021-05-11
HC SEMITEK ZHEJIANG CO LTD
View PDF4 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the migration speed of electrons in the n-type GaN layer is much higher than that of holes in the p-type GaN layer, and it is prone to excessive electron migration, and the electrons directly migrate to the p-type GaN layer, and non-radiative recombination occurs with holes.
The number of holes entering the multi-quantum well layer is reduced, reducing the luminous efficiency of the light-emitting diode

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Preparation method of light-emitting diode epitaxial wafer
  • Preparation method of light-emitting diode epitaxial wafer
  • Preparation method of light-emitting diode epitaxial wafer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] In order to make the purpose, technical solution and advantages of the present disclosure clearer, the implementation manners of the present disclosure will be further described in detail below in conjunction with the accompanying drawings.

[0033] figure 1 It is a schematic structural diagram of a light-emitting diode epitaxial wafer provided by an embodiment of the present disclosure. Refer to figure 1 It can be seen that the embodiment of the present disclosure provides a method for preparing a light-emitting diode epitaxial wafer. The light-emitting diode epitaxial wafer includes a substrate 1 and an n-type GaN layer 2, a composite layer 3, a multi-quantum well layer 4 and p-type GaN layer 5 . The composite layer 3 includes an AgGaN sublayer 31 and an AlGaN sublayer 32 sequentially stacked on the n-type GaN layer 2 .

[0034] A composite layer 3 is inserted between the n-type GaN layer 2 and the multi-quantum well layer 4 , and the composite layer 3 includes an A...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
temperatureaaaaaaaaaa
Login to View More

Abstract

The invention provides a preparation method of a light-emitting diode epitaxial wafer, and belongs to the field of light-emitting diode manufacturing. A composite layer is inserted between the n-type GaN layer and the multi-quantum well layer, and the composite layer comprises an AgGaN sub-layer and an AlGaN sub-layer which are sequentially stacked on the n-type GaN layer. The AgGa metal compound in the AgGaN sub-layer can effectively capture the electrons, so that the number of the electrons entering the AgGaN sub-layer from the AgGaN sub-layer is reduced. The AlGaN sub-layer with a high potential barrier can further block electrons, the the capturing of the electrons by the AlGaN sublayer and the potential barrier of the AlGaN sub-layer can play a dual blocking role, the density of the electrons entering the multi-quantum well layer is greatly reduced, the possibility of electron overflow is low, the time for holes to enter the multi-quantum well layer is longer, the number of holes entering the multi-quantum well layer is greatly increased, and the luminous efficiency of the light-emitting diode is effectively improved.

Description

technical field [0001] The disclosure relates to the field of light-emitting diode fabrication, in particular to a method for preparing a light-emitting diode epitaxial wafer. Background technique [0002] A light emitting diode is a semiconductor electronic component that emits light. As an efficient, environmentally friendly and green new solid-state lighting source, it is being rapidly and widely used, such as traffic lights, car interior and exterior lights, urban landscape lighting, mobile phone backlight, etc. Improving the luminous efficiency of chips is the goal that LEDs are constantly pursuing. [0003] The light-emitting diode epitaxial wafer is the basic structure used to prepare light-emitting diodes. The light-emitting diode epitaxial wafer includes at least a substrate and an n-type GaN layer, a multi-quantum well layer and a p-type GaN layer stacked on the substrate in sequence. The n-type GaN layer The donated electrons recombine with the holes donated by t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L33/06H01L33/14H01L33/00
CPCH01L33/06H01L33/14H01L33/145H01L33/007
Inventor 曹阳王群梅劲
Owner HC SEMITEK ZHEJIANG CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products