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A defect detection method, device, equipment and storage medium

A defect detection and defect location technology, which is applied to measuring devices, processing detection response signals, instruments, etc., can solve the problems of low automation, difficulty, and low efficiency, and achieve the effect of improving automation and efficiency

Active Publication Date: 2022-02-18
COMAC +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, due to the complexity of the structure of the composite material, the ultrasonic signal is complicated, which will bring certain difficulties to experienced professionals in judging the nature of the defect by combining the A-scan image and the C-scan image, and the degree of automation of defect detection is not high, and the detection time Long, low efficiency, will also bring some human error

Method used

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  • A defect detection method, device, equipment and storage medium
  • A defect detection method, device, equipment and storage medium
  • A defect detection method, device, equipment and storage medium

Examples

Experimental program
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Embodiment 2

[0062] figure 2 It is a flow chart of the defect detection method in the second embodiment of the present invention. The second embodiment is further optimized on the basis of the first embodiment, and the area information of the defect region for determining the nature of the defect is determined. Such as figure 2 As shown, the method includes:

[0063] Step 201. Determine the defect area of ​​the object to be inspected according to the ultrasonic pulse reflection C-scan image of the object to be inspected.

[0064] Step 202 , according to the position of the defect area, extract the defect A-scan image part from the ultrasonic pulse reflection A-scan image of the object to be detected.

[0065] Step 203: Scanning the image part according to the defect A to determine the nature of the defect of the object to be detected.

[0066] Step 204, if the nature of the defect is a macro defect, determine the defect area and defect depth of the object to be detected.

[0067] Whe...

Embodiment 3

[0083] image 3 It is a schematic structural diagram of the defect detection device in Embodiment 3 of the present invention. This embodiment is applicable to the situation where the defect properties of the object to be inspected are determined according to the ultrasonic pulse reflection C-scan image and A-scan image of the object to be inspected. Such as image 3 As shown, the device includes:

[0084] The defect area determining module 310 is configured to determine the defect area of ​​the object to be inspected according to the ultrasonic pulse reflection C-scan image of the object to be inspected.

[0085] The defect A-scan image portion extraction module 320 is configured to extract the defect A-scan image portion from the ultrasonic pulse reflection A-scan image of the object to be inspected according to the position of the defect area.

[0086] The defect property determination module 330 is configured to determine the defect property of the object to be detected a...

Embodiment 4

[0111] Figure 4 It is a schematic structural diagram of a computer device provided in Embodiment 4 of the present invention. Figure 4 A block diagram of an exemplary computer device 12 suitable for implementing embodiments of the invention is shown. Figure 4 The computer device 12 shown is only an example, and should not impose any limitation on the functions and scope of use of the embodiments of the present invention.

[0112] Such as Figure 4 As shown, computer device 12 takes the form of a general-purpose computing device. Components of computer device 12 may include, but are not limited to, one or more processors or processing units 16 , system storage 28 , bus 18 connecting various system components including system storage 28 and processing unit 16 .

[0113] Bus 18 represents one or more of several types of bus structures, including a storage device bus or controller, a peripheral bus, an accelerated graphics port, a processor, or a local bus using any of a vari...

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Abstract

The embodiment of the present invention discloses a defect detection method, device, equipment and storage medium. The defect detection method includes: determining the defect area of ​​the object to be detected according to the ultrasonic pulse reflection C-scan image of the object to be detected; according to the position of the defect area, The defect A-scan image part is extracted from the ultrasonic pulse reflection A-scan image of the object to be detected; and the defect property of the object to be detected is determined according to the defect A-scan image part. The embodiment of the present invention finds the corresponding defect A scan image part according to the defect area, and determines the defect property according to the defect A scan image part. Determination of defect properties by combining ultrasonic pulse reflection C-scan images and A-scan images provides a basis for further determination of defect area and improves the efficiency of defect detection; the combination of C-scan images and A-scan images can automatically determine defect properties and improve The degree of automation of defect detection is improved.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of ultrasonic nondestructive testing, and in particular to a defect detection method, device, equipment and storage medium. Background technique [0002] With the development of material technology, more and more advanced materials are put into use. Advanced composite laminates currently used in large passenger aircraft have become an important development trend in the aviation field. Because internal defects such as delamination, inclusions, pores, dense pores, and rich glue may occur during the production of composite laminates. Composite laminates therefore need to be inspected for defects before they are put into use. [0003] At present, ultrasonic nondestructive testing is one of the important methods for quality testing of mechanical engineering materials. The principle is that when the ultrasonic wave propagates in the material to be tested, the acoustic characteristics of th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N29/11G01N29/04G01N29/44
CPCG01N29/11G01N29/04G01N29/4418
Inventor 刘奎肖鹏孟嘉倪金辉陈健张继敏陈智超
Owner COMAC