Equipment defect time prediction method based on capacitive equipment defect data
A technology for capacitive equipment and time prediction, applied in the direction of kernel methods, neural learning methods, biological neural network models, etc., can solve problems such as inconsistency, complexity, and loss of equipment parameter performance
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[0043] Below in conjunction with the appendix of the present invention Figure 1~4 , clearly and completely describe the technical solutions in the embodiments of the present invention, obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other implementations can be obtained by those skilled in the art without making creative efforts.
[0044] In this implementation, please refer to figure 1 ,
[0045] S1: Perform data cleaning processing on the capacitive equipment defect data set: remove more than 70% of the missing values, and use the K nearest neighbor algorithm and random forest algorithm to fill the missing values for more than 30% of the missing values; draw each feature according to the data characteristics The box plot, and thus remove the data to remove outliers; delete all redundant data and empty data;
[0046] Firstly, the outliers of the capaci...
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