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Ultrafast microscopic imaging system capable of simultaneously obtaining depth and surface information

A technology of surface information and microscopic imaging, applied in instruments, measuring devices, optical devices, etc., can solve the problem of not being able to obtain the depth and surface information of the sample to be measured at the same time with the same laser signal, and achieve a wide scanning range and high imaging frame. rate effect

Active Publication Date: 2021-06-11
CHONGQING UNIV
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Problems solved by technology

[0003] The invention provides an ultra-fast microscopic imaging system for obtaining depth and surface information at the same time, so as to solve the problem that the same laser signal cannot be used to obtain the depth and surface information of the sample to be measured at the same time

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  • Ultrafast microscopic imaging system capable of simultaneously obtaining depth and surface information
  • Ultrafast microscopic imaging system capable of simultaneously obtaining depth and surface information
  • Ultrafast microscopic imaging system capable of simultaneously obtaining depth and surface information

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Embodiment Construction

[0024] In order to enable those skilled in the art to better understand the technical solutions in the embodiments of the present invention, and to make the above-mentioned purposes, features and advantages of the embodiments of the present invention more obvious and understandable, the following describes the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings For further detailed explanation.

[0025] In the description of the present invention, unless otherwise specified and limited, it should be noted that the term "connection" should be understood in a broad sense, for example, it can be a mechanical connection or an electrical connection, or it can be the internal communication of two elements, it can be Directly connected or indirectly connected through an intermediary, those skilled in the art can understand the specific meanings of the above terms according to specific situations.

[0026] see figure 1 , is a ...

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Abstract

The invention provides an ultrafast microscopic imaging system capable of simultaneously obtaining depth and surface information, which comprises a laser generator, wherein an output end of the laser generator is connected with an input end of a first coupler through a dispersive medium, a first output end of the first coupler is connected with a first end of a circulator, a second end of the circulator is connected with a first end of a collimator, the second end of the collimator is aligned with the first input / output end of a diffraction device, the second input / output end of the diffraction device is aligned with the plane of a plano-convex lens, the convex surface of the plano-convex lens is aligned with a sample to be measured, the third end of the circulator is connected with the first input end of the second coupler, the second output end of the first coupler is connected with the second input end of the second coupler through an adjustable delay medium, the output end of the second coupler is connected with the input end of a detector, the output end of the detector is connected with the input end of a high-speed oscilloscope, and the output end of the high-speed oscilloscope is connected with a signal processing module.

Description

technical field [0001] The invention belongs to the field of ultrafast microscopic imaging, in particular to an ultrafast microscopic imaging system for simultaneously obtaining depth and surface information. Background technique [0002] There are two main types of ultrafast imaging, one is to use one-dimensional diffraction devices such as prisms and gratings to diffract ultrafast laser light one-dimensionally, so as to perform line scanning on the sample to be tested, and the other is to use a combination of gratings and virtual phase arrays Two-dimensional diffraction of ultrafast laser light, so as to scan the surface of the sample to be tested. Although this method has a good application prospect in the field of microscopic imaging, it cannot obtain the depth information of the sample to be tested. At present, optical coherence tomography (OCT) technology is usually used to measure the depth information of the sample to be tested. This technology is to irradiate the l...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/22G01B9/02
CPCG01B11/22G01B9/02041
Inventor 高磊黄景晟曹玉龙朱涛
Owner CHONGQING UNIV
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