Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Defect detection method for high-brightness and high-reflectivity part

A defect detection and parts technology, which is applied in the field of high-brightness and high-reflection parts defect detection, can solve the problems of fixed 2D camera angle, damage to the eyesight of inspectors, and inability to cover all areas of parts, etc., to achieve the effect of increasing versatility and convenience

Pending Publication Date: 2021-06-11
慧三维智能科技(苏州)有限公司
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] For parts with high brightness and high reflection, the existing detection methods mainly rely on manual naked eye detection, which not only has low efficiency, poor accuracy and consistency, but also damages the visual health of inspectors
[0004] Another detection method is to use a 2D camera to shoot directly, but this detection method can only be used for shooting and recognition of parts that are close to the plane and have stable gloss. It is a part with a complex shape, and the 2D camera will have a fixed angle and cannot cover all areas of the part.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Defect detection method for high-brightness and high-reflectivity part
  • Defect detection method for high-brightness and high-reflectivity part
  • Defect detection method for high-brightness and high-reflectivity part

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0026] see Figure 1 to Figure 7 , the embodiment of the present invention includes:

[0027] A method for detecting defects of high-brightness and high-reflection parts, comprising the following steps:

[0028] Step 1: Prepare projector 1, industrial camera 2, arc-shaped translucent plate 3, measured part 4 and computer 5, connect the projector 1 and industrial camera 2 to the computer 5; The measuring part 4 is placed at the arc center of the arc-shaped translucent plate 3, the industrial camera 2 is placed outside the arc-shaped translucent plate 3, and at the center of the arc-shaped translucent plate 3 A circular hole 31 is opened, through...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the field of product detection, and discloses a high-brightness and high-reflectivity part defect detection method which comprises the following steps: preparing a projector, an industrial camera and an arc-shaped semitransparent plate; controlling the projector to project a stripe image to the arc-shaped semitransparent plate, enabling the measured part located at the arc center position of the arc-shaped semitransparent plate to reflect the stripe image displayed on the arc-shaped semitransparent plate, and enabling the industrial camera to collect the image reflected by the measured part; repeating the above steps to obtain images of multiple groups of different stripe images reflected on the measured part; synthesizing all the images, and synthesizing a result image with depth information; identifying the gray-scale value of the result image, and judging whether places with different gray-scale values exist on the result image or not, so as to judge whether the detected part has defects or not, and identifying the places with different gray-scale values. By means of the mode, flaws on the surfaces of the parts can be rapidly, accurately and stably detected.

Description

technical field [0001] The invention relates to the field of product detection, in particular to a method for detecting defects of high-brightness and high-reflection parts. Background technique [0002] The defect detection of parts has always been a difficult problem in the field of product inspection, especially for parts with high brightness and high reflection. These parts are widely distributed in various industrial products, such as important parts of automobiles, 3C, general consumer goods, aircraft and so on. In addition to appearance requirements, the purpose of testing is mostly functional requirements, and the defects of parts will directly affect the function and life of the product. [0003] For parts with high brightness and high reflection, the existing inspection methods mainly rely on manual naked eye inspection, which not only has low efficiency, poor accuracy and consistency, but also damages the visual health of inspectors. [0004] Another detection m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
CPCG01N21/8851G01N2021/8887
Inventor 张翔顾海明余劲松
Owner 慧三维智能科技(苏州)有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products