Auxiliary tool for screening and testing NTC (Negative Temperature Coefficient) thermistor chip with surface electrode

Abstract

The invention discloses an auxiliary tool for screening and testing an NTC thermistor chip with a surface electrode, which is used for screening and testing the NTC thermistor chip with the surface electrode and comprises a conductive and transverse common electrode plate, a transverse insulating substrate, a transverse insulating cover plate and a metal column with a vertical axial direction, a plurality of substrate through holes are formed in the insulating substrate, a plurality of cover plate through holes are formed in the insulating cover plate, the cover plate through holes comprise small-aperture through holes and large-aperture through holes, the metal columns comprise small-outer-diameter columns and large-outer-diameter columns, the insulating cover plate, the insulating substrate and the common electrode plate are sequentially connected in an overlapped mode in the vertical direction, the large-outer-diameter columns are arranged in the large-aperture through holes, and the small-outer-diameter columns are arranged in the through holes of the base plate. By adding the metal columns and the insulation base plates for limiting the metal columns, the NTC thermistor chip is arranged between the small-outer-diameter column of the metal column and the common electrode plate during testing, and a testing pen point is in contact with the metal column and does not contact the surface of the resistor chip, so that the surface of the resistor chip cannot be scratched.

Description

technical field [0001] The invention relates to an auxiliary tooling for electronic testing, in particular to an auxiliary tooling for screening and testing NTC thermistor chips with surface electrodes. Background technique [0002] NTC (Negative Temperature Coefficient) refers to the thermistor phenomenon and material that decreases exponentially with temperature rise and has a negative temperature coefficient. Or two or more metal oxides are fully mixed, formed, sintered and other semiconductor ceramics can be made into a thermistor with a negative temperature coefficient, that is, an NTC thermistor, and its core component is an NTC thermistor chip. [0003] The main performance index of the NTC thermistor chip is the resistance value-temperature correspondence relationship of the product. At the same time, the stability under different test conditions needs to be assessed, and the change rate of the zero-power resistance value at the specified temperature and the integrit...

AI Technical Summary

Problems solved by technology

[0008] 1. The tip of the test pen directly touches the surface of the resistor chip. Since the gold or silver of the two electrodes of the NTC thermistor chip is soft metal, its surface is easily scratched by the tip of the test pen, and it is also easy to cause defects in the corners of the resistor chip, thus Damage the resistor chip or reduce the performance of the resistor chip;

[0009] 2. The tip of the test pen directly touches the surface of the resistance chip, which will cause the displacement of the resistance chip with the movement of the test pen, resulting in confusion in the product sequence and poor repeatability of the resistance value test, which is not conducive to the implementation of automatic data collection in the later stage and affects the test accuracy. At the same time, it has high requirements for the skills of the operators, that is, the requirements for the strength of the operators are relatively high;

[0011] 4. Since the resistance chip is close to the wall of the installation hole, the test pen is easy to contact with the copper plate, that is, the common electrode copper plate, which affects the test result

Images