Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

SNP Molecular Markers Related to Wheat Stem Rot Resistance and Its Application

A stem rot, molecular marker technology, applied in recombinant DNA technology, microbial determination/inspection, DNA/RNA fragment, etc. The effect of saving experiment cost and practice and saving experiment cost

Active Publication Date: 2022-04-12
CHINA AGRI UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these disease-resistant loci are all from foreign materials, and their distribution in my country's wheat varieties is still unclear.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • SNP Molecular Markers Related to Wheat Stem Rot Resistance and Its Application
  • SNP Molecular Markers Related to Wheat Stem Rot Resistance and Its Application
  • SNP Molecular Markers Related to Wheat Stem Rot Resistance and Its Application

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention. Unless otherwise specified, the examples are all in accordance with conventional experimental conditions, such as Sambrook et al. Molecular Cloning Experiment Manual (Sambrook J & Russell DW, Molecular Cloning: a Laboratory Manual, 2001), or in accordance with the conditions suggested by the manufacturer's instructions. Example 1 Obtaining SNP Molecular Markers Related to Wheat Stem Rot Resistance

[0035] The present invention uses 55K single nucleotide polymorphism (SNP) sequences (chips purchased from Beijing Compson Biotechnology Co., Ltd.) to conduct genome-wide association studies on 358 Chinese winter wheat (including Sunco and Shan 253, which are resistant to susceptible control materials) (GWAS). Fusarium graminearum Wz2-8A 1×10 6 Soak 0.5-1cm germinated seeds in the spore / mL spore suspension, and plant them in plug trays. Whe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a SNP molecular marker related to wheat stalk rot resistance and application thereof. The present invention uses the natural population composed of 358 Chinese wheat germplasm resources to carry out genome-wide association analysis, and for the first time finds 5 SNP sites closely related to stem rot resistance on the long arm of the 5D chromosome of hexaploid wheat. KASP primers that can be used for large-scale material screening were further developed for these SNP sites, and the close correlation between the developed molecular markers and disease resistance was verified in the F2 and F2:3 populations constructed using resistant and susceptible materials as parents. These five SNP molecular markers provide an effective means for screening germplasm resources resistant to FCR in wheat.

Description

technical field [0001] The invention relates to the fields of molecular biology and plant molecular breeding, in particular to SNP molecular markers related to wheat stem rot resistance and applications thereof. Background technique [0002] Stem rot of wheat is a worldwide soil-borne disease caused by the infection of Fusarium spp., due to its strong saprophytic nature, wide range of hosts, the main diseased part is the base of the stem, and the disease can occur during the whole growth period. With the application of farming measures such as returning straw to the field and saving water and fertilizer, the disease has seriously threatened the safe production of wheat in my country and has become a common new disease. [0003] Planting disease-resistant varieties is one of the most effective measures to prevent and control the occurrence and damage of stem rot. So far, no materials showing high resistance to the disease have been found internationally, and only some materia...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): C12Q1/6895C12N15/11
CPCC12Q1/6895C12Q2600/156C12Q2600/13
Inventor 马骏甄文超金京京段硕楠齐永志解超杰李伟闫素红
Owner CHINA AGRI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products