Interface conversion circuit, chip, chip test system and method

Abstract

The invention discloses an interface conversion circuit, a chip, and a chip test system and method. The interface conversion circuit is arranged in the tested chip and comprises a data module, a write-in module, a read module and a comparison output module. The input end of the data module is connected with main control equipment; the data module is used for obtaining test excitation data and expected response data according to a test vector sent by the main control equipment; the input end of the write-in module is connected with the first output end of the data module, and the output end of the write-in module is connected with the input end of the test access port of the tested chip; the input end of the read module is connected with the output end of the test access port, and is used for collecting read data fed back by the tested chip; the first input end of the comparison output module is connected with the second output end of the data module, and the second input end is connected with the output end of the reading module; and the comparison output module is used for obtaining and outputting an error signal according to the read data and the expected response data. According to the embodiment of the invention, the flexibility and the efficiency of chip testing can be improved.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of chip testing, and in particular to an interface conversion circuit, a chip, a chip testing system and a method. Background technique [0002] In order to ensure that the chip can work properly, the chip must be rigorously tested during and after the chip is manufactured. Usually, the chip test is carried out through the Joint Test Action Group (JTAG) test pin. The test method of the standard JTAG protocol is to pour test vectors into the chip at the test data input port, and then obtain the test vector at the test data output port. The response signal of the chip is used to detect whether the function of the chip is normal. The test circuit inside the chip is responsible for receiving and executing the test vector sent by the external test system, and then feedback the result vector to the external chip test system. With the high development of computing requirements, software ...

AI Technical Summary

Problems solved by technology

With the high development of computing requirements, the software has higher and higher requirements for computing power, resulting in larger and larger chips and more complex test vectors, making the time required for chip testing longer and longer.

Therefore, the existing chip testing methods have the problems of poor flexibility and low efficiency.

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