A high-precision high-low temperature monitoring circuit with embedded calibration algorithm and its calibration method

Abstract

The invention relates to a high-precision high-low temperature monitoring circuit with an embedded calibration algorithm, including a high-low temperature monitoring overall circuit and a calibration control logic circuit; the high-low temperature monitoring overall circuit includes a bandgap reference circuit, a timing control circuit, and a high-low temperature monitoring circuit , a high-low temperature monitoring and judgment circuit, and an output control logic circuit; the invention also relates to a calibration method of a high-precision high-low temperature monitoring circuit with a built-in calibration algorithm. The present invention can automatically calibrate the high and low temperature detection thresholds at any normal temperature (10°C to 41°C), thereby improving the junction temperature measurement accuracy of the chip, thereby improving the yield rate of the chip, and at the same time greatly reducing the test at low temperature and high temperature. The workload is greatly reduced, and the cost of testing is greatly reduced.

Description

technical field [0001] The invention relates to the technical field of semiconductor integrated circuit circuits, in particular to a high-precision high-low temperature monitoring circuit and a calibration method with an embedded calibration algorithm. Background technique [0002] In a semiconductor chip, an internal junction temperature monitor is used to monitor the real-time junction temperature inside the chip to ensure that the chip does not work abnormally or is damaged, usually including a high temperature monitor and a low temperature monitor. [0003] When the junction temperature of the chip is higher than a set temperature threshold (such as 110°C) or lower than a set temperature threshold (such as -30°C), an early warning signal will be output to the SoC, and the SoC will respond according to the set temperature. The rules make corresponding protection operations. [0004] Currently on the market, the internal junction temperature monitor of the chip usually do...

AI Technical Summary

Problems solved by technology

Affected by the process of the chip, under normal circumstances, for such a temperature monitor, the temperature monitoring threshold set by it varies greatly among different chips, and some even reach a deviation of more than 20 degrees Celsius, resulting in a very low yield rate.

Moreover, testing at low temperature (such as around -35°C) and high temperature (such as around 110°C) will lead to very low test efficiency, high test time cost and economic cost

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