Calibration algorithm embedded high-precision high and low temperature monitoring circuit and calibration method

Abstract

The invention relates to a calibration algorithm embedded high-precision high and low temperature monitoring circuit, which comprises a high and low temperature monitoring integral circuit and a calibration control logic circuit, wherein the high and low temperature monitoring integral circuit comprises a band-gap reference circuit, a time sequence control circuit, a high and low temperature monitoring circuit, a high and low temperature monitoring judgment circuit and an output control logic circuit; The invention further relates to a calibration method of the calibration algorithm embedded high-precision high and low temperature monitoring circuit. The high and low temperature detection thresholds can be automatically calibrated at any normal temperature (10-41 DEG C), the junction temperature measurement precision of the chip is improved, the yield of the chip is further improved, meanwhile, the workload of testing at low temperature and high temperature is greatly reduced, and the testing cost is greatly reduced.

Description

technical field [0001] The invention relates to the technical field of semiconductor integrated circuit circuits, in particular to a high-precision high and low temperature monitoring circuit with an embedded calibration algorithm and a calibration method. Background technique [0002] In a semiconductor chip, the internal junction temperature monitor is used to monitor the real-time junction temperature inside the chip to ensure that the chip does not work abnormally or is not damaged, and usually includes a high temperature monitor and a low temperature monitor. [0003] When the junction temperature of the chip is higher than a set temperature threshold (such as 110°C) or lower than a certain set temperature threshold (such as -30°C), an early warning signal will be output to the SoC chip, and the SoC chip will respond according to the set temperature threshold. The rules make corresponding protection operations. [0004] Currently on the market, internal junction temper...

AI Technical Summary

Problems solved by technology

Affected by the process of the chip, under normal circumstances, for such a temperature monitor, the temperature monitoring threshold set by it varies greatly among different chips, and some even reach a deviation of more than 20 degrees Celsius, resulting in a very low yield rate.

Moreover, testing at low temperature (such as around -35°C) and high temperature (such as around 110°C) will lead to very low test efficiency, high test time cost and economic cost

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