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Cone motion test method of tilt angle sensor

A technology of inclination sensor and cone motion, applied in instruments, measuring devices, etc., can solve the problems of insufficient dynamic characteristics and single motion form.

Active Publication Date: 2021-06-29
NAT INST OF METROLOGY CHINA +1
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  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to propose a conical motion testing method of an inclination sensor, generate two degrees of freedom inclination motion through a Stewart platform, test the dynamic characteristics of the inclination sensor, and solve the deficiencies in the dynamic characteristics and single motion form of the turntable test method

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  • Cone motion test method of tilt angle sensor
  • Cone motion test method of tilt angle sensor
  • Cone motion test method of tilt angle sensor

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Embodiment Construction

[0034] In order to test the dynamic characteristics of the inclination sensor and solve the shortcomings of the turntable test method, such as insufficient dynamic characteristics and single motion form, the present invention proposes a conical motion test method for the inclination sensor, which generates two degrees of freedom inclination motion through the Stewart platform. The present invention will be described in detail below in conjunction with the accompanying drawings and specific implementation examples.

[0035] refer to figure 1 It is a schematic diagram of an implementation example device of the method of the present invention, and the device mainly includes: a Hooke hinge 1, a moving joint 2, a spherical hinge 3, a lower branch chain 4, an upper branch chain 5, a static platform 6, a dynamic platform 7, and a MEMS inclination sensor 8 , Servo motor 9. The upper branch chain 5 and the lower branch chain 4 are connected through the moving joint 2, the upper branch...

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Abstract

The invention discloses a cone motion test method for a tilt angle sensor. The method comprises the steps: building a follow-up coordinate system, enabling a servo motor to drive a branched chain to move through a motion controller, and generating cone motion around a Z axis; calibrating kinematics parameters such as spherical hinge coordinates, hooke joint coordinates, telescopic leg initial offset and the like of a Stewart platform through a laser tracker, establishing an accurate position positive solution model of the Stewart platform, and eliminating the influence of amplitude attenuation and phase lag of closed-loop response of a servo motor; and then installing a MEMS tilt angle sensor on a movable platform, calculating the actual conical motion trail through the position positive solution model to serve as a reference measured value, comparing the reference measured value with a measured value of the tilt angle sensor, and completing testing and calibration of the MEMS tilt angle sensor. The Stewart platform can generate conical motion around the Z axis, the conical point can be changed according to requirements, and compared with one-dimensional rotation motion, the conical motion has more superiority.

Description

technical field [0001] The invention belongs to the field of metrology and testing, and is especially suitable for dynamic testing of micro-electromechanical system (MEMS) inclination sensors and inertial measurement units. Background technique [0002] MEMS dynamic inclination sensor is a high-performance inertial measurement device, which can measure the attitude parameters of the moving carrier, and is suitable for inclination measurement in the state of motion and vibration. It is mainly composed of an accelerometer and a gyroscope. Because the accelerometer measurement data is usually susceptible to noise caused by external environmental interference, and the gyroscope measurement data has drift errors due to integration, it can be realized in real time through the information fusion algorithm of the two. Dynamic inclination output, and improve working stability. [0003] In order to ensure the validity of the measurement results, it is necessary to test the MEMS incli...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C25/00
CPCG01C25/005
Inventor 刘志华符磊蔡晨光陶猛张颖叶文夏岩
Owner NAT INST OF METROLOGY CHINA