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Anti-deformation device for heat treatment of test probe

A testing probe and anti-deformation technology, applied in heat treatment furnaces, heat treatment equipment, furnaces, etc., can solve problems such as easy generation of large deformation, and achieve the effects of improving production efficiency, good market promotion and application prospects, and low manufacturing costs.

Pending Publication Date: 2021-07-09
渭南木王智能科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] The purpose of the present invention is to provide an anti-deformation device for heat treatment of test probes, which solves the problem that the test probes are prone to large deformations during heat treatment

Method used

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  • Anti-deformation device for heat treatment of test probe
  • Anti-deformation device for heat treatment of test probe

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Embodiment Construction

[0019] The following describes in detail the embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary, only used to explain the present invention, and should not be construed as a limitation of the present invention.

[0020] In the description of the present invention, if it is described that the first and the second are only for the purpose of distinguishing technical features, it should not be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features or implicitly indicating The order of the indicated technical features.

[0021] In the description of the present invention, unless otherwise clearly defined, words such as setting, in...

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Abstract

The invention discloses an anti-deformation device for heat treatment of a test probe. The anti-deformation device comprises a base, an upper pressing plate, and a first side pressing plate, wherein a plurality of first limiting grooves are formed on the base; the upper pressing plate is arranged on the base, and covers the plurality of first limiting grooves; the first side pressing plate is placed on the base, and is located on one side of the upper pressing plate, and a plurality of second limiting grooves are formed in the lower side of the first side pressing plate; and the first side pressing plate and the upper pressing plate are detachably fixed together. The anti-deformation device for heat treatment of the test probe solves the problem that the test probe is prone to large deformation in the heat treatment process.

Description

technical field [0001] The invention belongs to the technical field of probe processing equipment, and in particular relates to an anti-deformation device for heat treatment of test probes. Background technique [0002] The test probe, also known as the semiconductor probe, consists of a needle tube, a spring and a needle. After the test probe is assembled, it needs to be heat treated. Heat treatment refers to a metal thermal processing process in which the chemical composition and structure of the surface or interior of the material are changed by means of heating, heat preservation and cooling in a solid state to obtain the required properties. Specifically, it means that the test probe is placed in a heat treatment furnace for heating and heat preservation for a period of time and then cooled. [0003] However, the size of the test probe is small. Compared with equipment such as large steel structures, its material is relatively soft, and it is easy to deform during the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C21D9/00C21D1/00
CPCC21D9/0068C21D1/00
Inventor 张飞龙付盼红张明海申啸
Owner 渭南木王智能科技股份有限公司
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