A kind of silicon nitride single crystal and its preparation method and application
A technology of silicon nitride single crystal and nitrogen source, applied in the field of semiconductors, can solve the problems of low purity of silicon nitride, complicated process and great human injury, and achieve the effects of safe operation, simple steps and good quality.
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[0028] An aspect of the embodiments of the present invention provides a method for preparing a silicon nitride single crystal, which includes:
[0029] Provide SiC substrate;
[0030] Arranging multi-layer graphene as an intercalation layer on the SiC substrate to obtain a graphene / SiC substrate;
[0031] And, the graphene / SiC substrate is placed in the reaction chamber of the epitaxial growth equipment, a gaseous nitrogen source is introduced into the reaction chamber and epitaxial growth is carried out, so as to obtain a silicon nitride single crystal.
[0032] In some more specific embodiments, the SiC substrate includes any one of a 2H-SiC substrate, a 3C-SiC substrate, a 4H-SiC substrate, and a 6H-SiC substrate, and is not limited thereto.
[0033] Further, the SiC substrate includes a SiC substrate with a chamfered surface.
[0034] Further, the thickness of the multi-layer graphene is 0.34-3.4 nm.
[0035] Further, the number of layers of the multi-layer graphene is ...
Embodiment 1
[0061] (1) Using 6H-SiC as the substrate, directly epitaxially grow 2.04nm (6 layers) graphene as the insertion layer on the 6H-SiC substrate;
[0062] (2) Put the 6H-SiC substrate grown with multilayer graphene into the reaction chamber, and first pass H 2 The surface of the graphene / SiC substrate was cleaned at 1050°C for 10 minutes, and H 2 The rate is 17.5slm;
[0063] (3) Feed NH with a flow rate of 2.0L / min into the reaction chamber 3 As a nitrogen source, the growth temperature is 1100°C, the growth time is 10h, and Si 3 N 4 single crystal particles.
[0064] Si prepared in this example 3 N 4 Scanning electron microscope images of single crystal particles such as image 3 As shown, the atomic force microscope image as Figure 4 As shown, the energy spectrum is characterized as Figure 5 Shown; Si prepared in this embodiment 3 N 4 A spherical aberration-corrected transmission electron microscope image of a single crystal grain as Figure 6a-Figure 6b As shown...
Embodiment 2
[0066] (1) Using 4H-SiC as the substrate, directly epitaxially grow 3.4nm (10 layers) graphene as an insertion layer on the 4H-SiC substrate;
[0067] (2) Put the 4H-SiC substrate grown with 10 layers of graphene into the reaction chamber, and first pass H 2 The surface of the graphene / SiC substrate was cleaned at 900°C for 10 minutes, and H 2 The rate is 15slm;
[0068] (3) Feed NH with a flow rate of 2L / min into the reaction chamber 3 As a nitrogen source, the growth temperature is 1000°C, the growth time is 50h, and Si 3 N 4 single crystal particles.
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