Semiconductor probe table type dotting machine

Abstract

The invention relates to the field of dotting machine equipment, and discloses a semiconductor probe table type dotting machine which comprises a workbench, a dotting device is arranged at the upper end of the workbench, a hydraulic device is arranged at the rear end of the dotting device, a lifting column is arranged at the upper end of the hydraulic device, and a dotting platform is arranged at the upper end of the lifting column. A dotting pressing head is arranged at the front end of the dotting platform, a dotting mechanism is arranged in the dotting device, a supporting column is arranged at the side end of the dotting mechanism, and a positioning chuck is arranged in the dotting device. According to the semiconductor probe table type dotting machine, dotting is achieved from multiple different directions through multiple shafts, the dotting efficiency of the device is improved, the position of the dotting mechanism can be conveniently adjusted, the depth and height of each shaft can be finely adjusted, the application range of the dotting machine is widened, dotting workpieces can be conveniently replaced, the dotting efficiency is improved, the machining time is saved, the labor intensity of workers is reduced, and the usability is improved.

Description

technical field [0001] The invention relates to the field of dotting machine equipment, in particular to a desktop dotting machine for semiconductor probes. Background technique [0002] The dotting machine, also known as the tensile sample gauge, is a special equipment designed and manufactured according to the national standard GB / T228-2002 "Metal Materials Tensile Test Method at Room Temperature", which can be divided into manual dotting machine and electric dotting machine. The dotting machine is also called continuous marking machine and gauge distance meter. It is used for marking round steel, flat steel, steel pipe, section steel and other non-ferrous metal materials for tensile samples. [0003] There are certain disadvantages in the use of the existing semiconductor probe desktop dotting machines. First of all, the current semiconductor probe desktop dotting machines use single-axis or double-axis to do the marking on the workpiece, which makes it impossible to do d...

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Problems solved by technology

[0003] The existing desktop dotting machines for semiconductor probes have certain disadvantages in use. First, the current desktop dotting machines for semiconductor probes use single-axis or two-axis to dot the workpiece, which makes it impossible to do different positions on the workpiece. The limitation of the direction limits the scope of use of the dotting machine. Secondly, the dotting mechanism cannot be adjusted, which makes the dotting machine limit the length and height of the workpiece, making the applicable workpiece of the dotting machine fixed, and cannot process different types of workpieces. The usability is poor. , when the dotting machine is processing the workpiece, it can only do a single dotting on the workpiece, and it is time-consuming and laborious to install and disassemble a single workpiece, and the processing efficiency is poor. Therefore, we propose a semiconductor probe desktop dotting machine

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