Single-head spring test probe

Abstract

A single-head spring test probe disclosed by the present invention comprises a TOP probe head and a center spring, the TOP probe head comprises a front section part, a middle section part and a tail section part which are integrally formed, wherein the front section part, the middle section part and the tail section part are all of a cylinder structure, the upper end of the front section part is provided with a probe head structure, the middle part of the middle section part is provided with a flange clamping groove. The diameter of the center spring is decreased from the middle to the two ends, the middle section is clamped to any end of the center spring through a flange clamping groove, the upper end of the front section and the upper end of the middle section are both located outside the end, and the lower end of the middle section part and the tail section part are both located inside a spring ring at the end and can both make contact with the spring ring at the end. The invention aims to provide the single-head spring test probe which is simple in structure and few in assembly parts, the difficulty of an assembly process is reduced, and the assembly efficiency is further improved; and meanwhile, the early-stage cost is also reduced.

Description

technical field [0001] The invention relates to the technical field of probes, in particular to a single-headed spring test probe. Background technique [0002] The probe is the contact medium for electrical testing, and is a high-end precision electronic hardware component. The assembly of the existing double-ended spring test probe combination is cumbersome and complicated, and the assembly process is difficult, which has the disadvantages of high initial cost and low assembly efficiency. Therefore, for a single-head spring test probe, the existing double-head spring test probe has the disadvantages of cumbersome and complicated assembly, high difficulty in assembly process, high initial cost and low assembly efficiency, which are the problems we need to solve. Contents of the invention [0003] In order to overcome the above disadvantages, the object of the present invention is to provide a single-headed spring test probe, which has a simple structure and fewer assembl...

AI Technical Summary

Problems solved by technology

The assembly of the existing double-headed spring test probe combination is cumbersome and complicated, and the assembly process is difficult, which has the disadvantages of high initial cost and low assembly efficiency

Therefore, for a single-head spring test probe, the existing double-head spring test probe has the disadvantages of cumbersome and complicated assembly and high difficulty in assembly process, high initial cost and low assembly efficiency. This is the problem we have to solve.

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