FPGA logic test method and device

Abstract

The invention belongs to the technical field of integrated circuits, and particularly provides an FPGA logic test method and device. The method comprises the following steps: based on a to-be-tested signal bandwidth and a sampling depth of a to-be-tested logic source code, determining a required resource storage amount required for testing the to-be-tested logic source code; if the required resource storage amount is smaller than the residual storage amount of the FPGA on-chip memory, determining that the storage mode is on-chip storage, otherwise, determining that the storage mode is off-chip storage, wherein the memory corresponding to the on-chip memory is an FPGA on-chip memory, and the memory corresponding to the off-chip memory is an external memory; and testing the to-be-tested logic source code based on the kernel of the embedded logic analyzer, and storing sampling data generated by the test into a corresponding memory according to the determined storage mode. According to the invention, the problem of low sampling depth caused by an internal storage space during FPGA testing can be avoided, so that the sampling depth during testing is effectively improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to an FPGA logic testing method and device. Background technique [0002] FPGA (Field Programmable Gate Array, Field Programmable Gate Array) is a general-purpose device that includes a large number of repetitive basic units such as programmable logic blocks (CLBs), input-output units (IOBs), and programmable interconnects (PIs). It is especially suitable for the development of new integrated circuits and the production of small batches of ASIC circuits. With its rapid development, it has been widely used in many fields. With the wide application of FPGA, the requirements for its accuracy are getting higher and higher, so all FPGAs need to be tested and verified reasonably. [0003] Currently, there are usually two methods for FPGA logic testing: one is to use an external oscilloscope or logic analyzer, and the other is to use an embedded logic analyzer. Using an exter...

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Problems solved by technology

[0005] Aiming at the defects in the prior art, the present invention provides a FPGA logic test method and device, electronic equipment and medium, to solve the problem that the signal sampling depth is limited when using an embedded logic analyzer for FPGA logic test

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