High-temperature, high-humidity and high-voltage reverse bias test system for high-voltage and high-power device and test method thereof

Abstract

The invention discloses a high-temperature, high-humidity and high-voltage reverse bias test system for a high-voltage and high-power device and a test method thereof. The reliability of more than 80 paths of TO power devices in a high-temperature, high-humidity and high-voltage environment can be examined at the same time, and according to the types and sizes of the other package devices such as a welding module, a crimping module and the like, different types of packaged power devices are flexibly tested. The experiment platform is low in price, the experiment working condition is flexible, and considerable economic benefits can be achieved.

Description

technical field [0001] The invention relates to the field of reliability testing of power semiconductor devices, in particular to a high-temperature, high-humidity, high-voltage reverse bias testing system and a testing method for high-voltage and high-power devices. Background technique [0002] With the rapid development of flexible DC transmission technology and new energy power technology, the reliability of its core power electronic power devices has attracted more and more attention. In particular, power devices in offshore wind power generation and electric vehicles will be in a more stringent operating environment of high temperature, high humidity and high pressure, so reliability testing is especially necessary. At present, the reliability test of high-temperature, high-humidity and high-voltage devices is to connect the source and drain of the device to high voltage and block the device by shorting the gate and source of the MOSFET device in a high-temperature and...

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Problems solved by technology

[0004] Aiming at one of these defects or defects such as the high price of the current reliability test platform, relatively limited test conditions, and a single number of test devices, the present invention provides a high-temperature, high-humidity, and high-voltage reverse-bias test system for high-voltage and high-power devices, which can not only Simultaneously assess the reliability of TO power devices with more than 80 circuits in high temperature, high humidity and high pressure environment, and flexibly test power devices in different types of packages according to other packages such as soldering modules, crimping modules, etc., and the price of the experimental platform Inexpensive, flexible test conditions, can achieve a considerable economic effect

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