Film uniformity detection system based on line structured light
A technology of film uniformity and detection system, which is applied in the testing of machine/structural components, optical instrument testing, and testing of optical properties, etc. It can solve the problem that there are many isolated noise points in the film image, affecting the subsequent processing of the image, and affecting the accuracy of film identification, etc. problem, to achieve the effect of fewer noise points and better image effect
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[0028] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.
[0029] see figure 1 , the embodiment of the present invention includes:
[0030] A film uniformity detection system based on line structured light, including an imaging unit, an acquisition unit, a processing unit, a storage unit, a control unit, a display unit, and an execution unit.
[0031] combine figure 2 , the imaging unit is used to generate a grid image, including a light source, an optical filter and a grid diffraction grating in turn, the light emitted by the light source passes through the filter to adjust the light intensity and wavelength of the light source, and then diffracted after passing through the grid diffraction grating L...
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