Unlock instant, AI-driven research and patent intelligence for your innovation.

Apparatus and method for analog-to-digital conversion

A technology of analog-to-digital conversion and analog-to-digital converter, which is applied in the direction of analog/digital conversion, analog-to-digital converter, analog/digital conversion calibration/testing, etc., and can solve problems such as bad and uncorrected

Pending Publication Date: 2021-12-03
INTEL CORP
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, no correction has been performed for the correction caused by the buffer nonlinearity
This results in limited spurious-free dynamic range (SFDR) performance, which gets even worse at higher radio frequency (RF) frequencies

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Apparatus and method for analog-to-digital conversion
  • Apparatus and method for analog-to-digital conversion
  • Apparatus and method for analog-to-digital conversion

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] Various examples will now be described more fully with reference to the accompanying drawings, in which some examples are illustrated. In the figures, the thickness of lines, layers and / or regions may be exaggerated for clarity.

[0015] Therefore, while other examples are capable of various modifications and alternative forms, some specific examples thereof are shown in the drawings and will be described in detail later. However, this detailed description does not limit the additional examples to the specific forms described. Additional examples may cover all modifications, equivalents, and alternatives falling within the scope of the disclosure. Like reference numerals designate like or similar elements throughout the description of the figures, which elements may be implemented identically or in modified form while providing the same or similar functionality when compared to each other.

[0016] It will be understood that when an element is referred to as being "co...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an apparatus and method for analog-to-digital conversion. The apparatus includes a first analog-to-digital converter (ADC), a second ADC, and a calibration unit. The first ADC is configured to sample an input analog signal at a first sampling frequency. The second ADC is configured to sample the input analog signal at a second sampling frequency. The second sampling frequency is a fraction of the first sampling frequency. The calibration unit is configured to correct a distortion incurred in an output of the first ADC based on an output of the second ADC. The first ADC may be a time-interleaved ADC. The second ADC may be an extra sub-ADC of the time-interleaved ADC. The second ADC may be configured to sample the input analog signal at random sampling phases. A dithering noise may be added to the input analog signal of the second ADC. The calibration unit may be a non-linear equalizer.

Description

technical field [0001] Examples relate to analog-to-digital conversion, and more particularly to a method and apparatus for calibrating a high-speed analog-to-digital converter (ADC) using a subsampled observation ADC. Background technique [0002] Correcting non-idealities in multi-gigasample-per-second ADCs is an extremely challenging problem. Conventionally, blind methods are used for direct current (DC) or gain mismatch correction or analog timing skew correction for time-interleaved ADCs preceded by wideband input buffers. However, no corrections have been performed for buffer non-linearity induced corrections. This results in limited spurious-free dynamic range (SFDR) performance, which gets even worse at higher radio frequency (RF) frequencies. Contents of the invention [0003] According to an aspect of the present disclosure, there is provided an apparatus for analog-to-digital conversion, comprising: a first analog-to-digital converter (ADC), the first ADC conf...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H03M1/10H03M1/12
CPCH03M1/1009H03M1/126H03M1/1215H03M1/1042H03M1/0678H03M1/0658H03M1/34
Inventor 卡姆兰·阿扎德特拉蒙·桑切斯阿尔伯特·莫利纳马丁·克拉拉丹尼尔·格鲁伯马泰奥·坎波内斯基
Owner INTEL CORP
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com