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Novel method for adjusting intensity of X-rays irradiating on surface of object to be measured

A technology of surface strength and object to be measured, applied in measurement devices, using wave/particle radiation, instruments, etc., can solve problems such as errors, and achieve the effect of convenient operation, simple structure, and guaranteed accuracy

Pending Publication Date: 2021-12-14
苏州艾克瑞特仪器有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, in the field of X-ray thickness gauges, the traditional technology generally uses laser ranging or infrared ranging to measure the distance between the measured object and the collimator to obtain the intensity of X-rays irradiating the surface of the measured object. However, the traditional technology of laser ranging and infrared ranging is to measure the object by directly hitting the light on the object, and then reflecting the light on the object and receiving it. This method is relatively traditional and has certain errors. The present invention provides a A new method for adjusting the intensity of X-ray irradiation on the surface of the object to be measured, to ensure the efficiency and accuracy of adjusting the intensity of X-ray irradiation on the surface of the object to be measured, and to ensure the efficiency and accuracy of measuring the thickness of the coating on the object

Method used

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  • Novel method for adjusting intensity of X-rays irradiating on surface of object to be measured

Examples

Experimental program
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Effect test

Embodiment 1

[0031] Embodiment 1: A new adjustment method for X-ray irradiation on the surface intensity of the object to be measured, such as figure 1 Shown, including the following working steps:

[0032] Step 1: Place an ultra-thin standard sheet on the object-to-be-tested stage 3, adjust the height adjustment knob 8 of the collimator sleeve, fix the height adjustment knob 8 of the collimator sleeve to a certain position, and adjust the precision adjustable potentiometer 6 It is connected with the height adjustment knob 8 of the collimator sleeve through the toothed transmission belt 7, rotates together with the height adjustment knob 8 of the collimator sleeve, and reads the resistance value from the precision adjustable potentiometer 6, which can be converted into the object to be measured Subtract the thickness of the ultra-thin standard sheet from the distance between the stage 3 and the collimator sleeve 2 to obtain the distance l between the surface of the standard sheet and the c...

Embodiment 2

[0038] Embodiment two: a new method for adjusting the intensity of X-ray irradiation on the surface of the object to be measured, such as figure 1 Shown, including the following working steps:

[0039] Step 1: Place an ultra-thin standard sheet on the object-to-be-tested stage 3, adjust the height adjustment knob 8 of the collimator sleeve, fix the height adjustment knob 8 of the collimator sleeve to a certain position, and adjust the precision adjustable potentiometer 6 It is connected with the height adjustment knob 8 of the collimator sleeve through the toothed transmission belt 7, rotates together with the height adjustment knob 8 of the collimator sleeve, and reads the resistance value from the precision adjustable potentiometer 6, which can be converted into the object to be measured Subtract the thickness of the ultra-thin standard sheet from the distance between the stage 3 and the collimator sleeve 2 to obtain the distance l between the surface of the standard sheet a...

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Abstract

The invention relates to the field of X-ray thickness gauges, and discloses a novel method for adjusting the intensity of X-rays irradiating on the surface of an object to be measured. According to the novel method for adjusting the intensity of the X-rays irradiating on the surface of the object to be measured, a precise adjustable potentiometer is connected with a collimator sleeve height adjusting knob through a toothed transmission belt, and the distance l between the surface of a standard sheet and a collimator sleeve can be calculated, so that the intensity of the X-rays received by the standard sheet can be obtained; 2, by adjusting the focal length of a camera, the camera obtains the clearest image of the standard sheet, namely the standard film is located at the focal point of the camera; and 3, the object to be measured is placed on a to-be-measured object carrying table, and the height of the to-be-measured object carrying table is adjusted, so that the top surface of the object to be measured is located on the focus of a focal length-adjustable camera, and the X-ray intensity obtained by the top surface of the object to be measured is ensured to be the same as the X-ray intensity in the step 1. According to the present invention, the structure is simple, the efficiency and the accuracy for measuring the thickness of a coating of the object are improved.

Description

technical field [0001] The invention relates to the field of X-ray thickness gauges, in particular to a new method for adjusting the intensity of X-ray irradiation on the surface of an object to be measured. Background technique [0002] At present, in the field of X-ray thickness gauges, the traditional technology generally uses laser ranging or infrared ranging to measure the distance between the measured object and the collimator to obtain the intensity of X-rays irradiating the surface of the measured object. However, the traditional technology of laser ranging and infrared ranging is to measure the object by directly hitting the light on the object, and then reflecting the light on the object and receiving it. This method is relatively traditional and has certain errors. The present invention provides a A new method for adjusting the intensity of X-ray irradiation on the surface of the object to be measured, to ensure the efficiency and accuracy of adjusting the intensi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B15/02
CPCG01B15/02
Inventor 刘安
Owner 苏州艾克瑞特仪器有限公司
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