Test method, device and equipment for storage unit of DDR chip and storage medium

A technology of storage unit and test method, applied in static memory, instruments, etc., can solve the problems of high detection cost and long detection time, and achieve the effect of improving the speed and accuracy of detection

Pending Publication Date: 2022-01-04
SHENZHEN TIGO SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] The invention provides a test method, device and storage medium of a storage unit of a DDR chip, so as to solve the problems of long detection time and high detection cost of the traditional method for detecting a DDR chip

Method used

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  • Test method, device and equipment for storage unit of DDR chip and storage medium
  • Test method, device and equipment for storage unit of DDR chip and storage medium
  • Test method, device and equipment for storage unit of DDR chip and storage medium

Examples

Experimental program
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Embodiment 1

[0040] see figure 1 , figure 1 It is a schematic flowchart of a method for testing a storage unit of a DDR chip provided by an embodiment of the present invention. The schematic flow chart provides a method for testing a storage unit of a DDR chip, and the method can be applied in the field of semiconductor testing. The method specifically includes the following steps:

[0041] S101, writing data into each storage unit of the DDR chip.

[0042] In a specific implementation, the DDR chip is a double-rate synchronous dynamic random access memory, which belongs to one type of memory. The purpose of writing data to the DDR chip is to perform coverage detection on the DDR chip with comprehensive written data so as to detect the sensitivity of the storage unit of the DDR chip to different data.

[0043] Write data is written with 0000 or 1111 (4bit) as data. If the storage unit is 32bit, there are 32 0s. Use the data to traverse all the storage units of the DDR chip, and fill ...

Embodiment 2

[0078] see image 3 , image 3 It is a schematic flowchart of a method for classifying DDR chips provided by an embodiment of the present invention. The method specifically includes the following steps:

[0079] S501, according to the method described in Embodiment 1, test the storage units of the DDR chip one by one.

[0080]In a specific implementation, the data in the storage unit is written, and the data in the storage unit in the preset area around the storage unit to be tested in the DDR chip is recorded. Perform logic operation on the storage unit to be tested, read the value of the storage unit to be tested after the logic operation, and check whether the value is the expected value after the logic operation. If the value is the expected value after the logical operation, the logical operation succeeds; if the value is not the expected value after the logical operation, the logical operation fails. Indicates that the chip has a transition fault (TF). After the log...

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PUM

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Abstract

The invention relates to a test method, device and equipment for a storage unit of a DDR chip and a storage medium, and relates to the field of semiconductor testing. The method comprises the following steps: writing data into each storage unit of the DDR chip; selecting a storage unit as a to-be-tested storage unit, and recording storage units around the to-be-tested storage unit as first data; performing logical operation on the to-be-tested storage unit to obtain an operation result; recording storage units around the to-be-tested storage unit as second data; comparing the logical operation result with a preset expected value to obtain a first comparison result; comparing the first data with the second data to obtain a second comparison result; and determining a test result of the to-be-tested storage unit according to the first comparison result and the second comparison result. According to the invention, the sensitive degree of the storage unit of the DDR chip to different data can be detected by performing logical operation and verification on the storage unit, and the storage unit of the DDR chip can be rapidly and accurately subjected to omnibearing detection through a verification result and comparison of the first data and the second data.

Description

technical field [0001] The invention relates to the field of semiconductor testing, in particular to a testing method, device, equipment and storage medium of a storage unit of a DDR chip. Background technique [0002] Today, with the rapid development of science and technology, semiconductor technology continues to develop. With the shrinking of transistors, diodes and other original components, the density of integrated circuit chips is increasing. The continuous increase in the number of connections between the integrated circuit chip and the circuit causes more and more frequent failures of the integrated circuit chip. Up to now, the fault detection of integrated circuits has become the focus and difficulty of integrated circuit technology research. [0003] Memory sensing is a critical yet independent part of an integrated circuit for several reasons: [0004] 1. Memory is one of the important components of electronic products, especially embedded system electronic pr...

Claims

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Application Information

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IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor李创锋
OwnerSHENZHEN TIGO SEMICON