Supercharge Your Innovation With Domain-Expert AI Agents!

A method of eliminating linear broadening under wavelength shift

A wavelength shift and line shape technology, applied in the field of ambient optics, can solve the complex and diverse problems of angle, wavelength shift, and line shape broadening of a single hardware structure, and achieve the effect of eliminating broadening and improving measurement accuracy.

Active Publication Date: 2022-07-05
ANHUI AGRICULTURAL UNIVERSITY
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the existing technology can solve the problem of wavelength shift to a certain extent, in the actual measurement process, the line type broadening is complicated and diverse, and it cannot be fundamentally solved only by changing the angle of the hardware structure.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method of eliminating linear broadening under wavelength shift
  • A method of eliminating linear broadening under wavelength shift
  • A method of eliminating linear broadening under wavelength shift

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] In this embodiment, see figure 1 , a linear widening and eliminating gas detection system, comprising: a laser 3, a controller 2, a function generator 1, a calibration path, a detection path, and an acquisition processor. Among them, the calibration path consists of a collimator 4, a standard reference cell 5, and a photodetector 6; the detection path consists of a collimator 7, a multiple reflection cell 8, and a photodetector 9;

[0051] The laser 1 is used as a detection light source to measure, and the temperature control and current control are performed by the controller 2, thereby changing the output wavelength of the laser 1; the function generator 1 provides the scanning signal and the modulation signal to the current driver of the controller 2, which act together on the laser 3. , tune the laser to stabilize the output; after the laser is split, it passes through the calibration channel and the detection channel, wherein the laser beam of the calibration chann...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for eliminating linear broadening under wavelength shift, which is processed based on a first harmonic signal, including: 1. removing background noise and then performing filtering processing; 2. standard first-harmonic fitting; Combined with the standard deviation of the fitted non-absorbing area as the evaluation criterion for the end of the standard first harmonic adaptive fitting, the standard first harmonic fitting signal is obtained, which provides a basis for the elimination of line broadening, and 3 times the signal adjustment , first perform coarse adjustment, and perform fine-tuning on local signal fitting and interpolation to eliminate broadening. The invention can solve the problem of line broadening under wavelength offset and improve the measurement accuracy through a method for eliminating line broadening under wavelength offset without increasing the hardware structure.

Description

technical field [0001] The invention relates to the field of environmental optics, in particular, aiming at the influence of line broadening caused by wavelength shift, and proposes a method for eliminating the line broadening caused by wavelength shift. Background technique [0002] When using laser spectroscopy technology for gas detection, temperature change, current scanning signal DC level drift, driving current and temperature drift, incomplete coupling of thermistor and laser chip, optical path, circuit aging, etc. will cause the laser wavelength shift. Lead to line broadening, affecting the accuracy of gas concentration measurement. Therefore, it is of great significance to effectively eliminate the problem of line broadening and improve the long-term stability and accuracy of the measurement. [0003] Existing researches mainly focus on improving hardware systems such as temperature control and phase locking to reduce drift, and rarely discuss how to eliminate the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/25
CPCG01N21/255G01N21/25
Inventor 唐七星王玉伟刘海秋刘路张玉钧陈东
Owner ANHUI AGRICULTURAL UNIVERSITY
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com