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On-line X fluorescence analyzer light path system capable of being automatically adjusted

一种荧光分析仪、自动调节的技术,应用在分析材料、使用波/粒子辐射进行材料分析、仪器等方向,能够解决环境温度变化波动大、调试工作困难、影响波长色散分析仪应用的效果等问题,达到减少工作量的效果

Pending Publication Date: 2022-01-11
DANDONG DONGFANG MEASUREMENT&CONTROL TECHCO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the precise structure of the spectroscopic system of the wavelength dispersion analyzer, it is currently suitable for laboratory analysis. However, if it is used for industrial online detection and analysis, due to the harsh conditions of some industrial production sites, such as large fluctuations in ambient temperature and continuous Vibration or large amplitude, etc., have seriously affected the application effect of the wavelength dispersion analyzer in the industrial field
[0006] In particular, after the wavelength dispersion analyzer has been operated in the industrial field for a period of time, with the influence of temperature changes and vibrations, the reflective focusing state of the spectroscopic crystal on the X-fluorescence will change, which will reduce the effective X-fluorescence intensity received by the detector and affect the analysis. precision
The current maintenance method for this kind of phenomenon is that the staff disassemble the analyzer and use manual adjustments, and the site is subject to unfavorable conditions such as large moisture, dust, and narrow space, which makes debugging very difficult

Method used

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  • On-line X fluorescence analyzer light path system capable of being automatically adjusted
  • On-line X fluorescence analyzer light path system capable of being automatically adjusted
  • On-line X fluorescence analyzer light path system capable of being automatically adjusted

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] like figure 1 As shown, in the inside of the light splitting housing (101), install four blocking blocks (102), and install the crystal platform (203);

[0028] like figure 1 , figure 2 As shown, the crystal base (202) is connected with the crystal base (203) through the pivot pin (204), and the crystal base (202) can rotate around the pivot pin (204); a spring piece ( 205), the spring piece (205) can be fixed on the crystal platform (203) with screws, and the raised part of the spring piece (205) is on one end of the crystal base (202); );

[0029] like figure 1 , figure 2 , image 3 As shown, the light-splitting housing (101) has a round hole, and the inside of the round hole is connected with a sealing sleeve (304); the crystal table (203) has a round hole, and the round hole of the crystal table (203) is connected to the light-splitting housing (101) ) is concentric, and the inner diameter of the round hole of the crystal platform (203) is the same as the i...

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PUM

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Abstract

The invention provides an on-line X fluorescence analyzer light path system capable of being automatically adjusted. According to the system, a crystal table and a crystal seat are arranged in a light splitting shell; the crystal seat is provided with a light splitting crystal and is connected with the crystal table through a shaft pin; the crystal holder can rotate, wherein the rotation angle of the crystal holder is adjusted by controlling worm and gear transmission through the motor; the rotation angle of the crystal holder is indirectly recorded through a multi-circle absolute value encoder, and the optimal rotation angle of the crystal holder is determined by processing the spectrum shape of counting rate-rotation angle. By controlling the motor, the light path is automatically adjusted, so that the effect of the whole light path is optimal, the situation that the analysis precision of an instrument is reduced due to the influence of adverse factors such as environment temperature change and vibration is avoided, the maintenance workload is reduced, and manual adjustment can be carried out without opening an instrument device.

Description

technical field [0001] The invention relates to the field of on-line analysis of industrial material components, in particular to an automatically adjustable on-line X fluorescence analyzer optical path system. Background technique [0002] X-ray fluorescence spectroscopy is a fast, non-destructive method of measuring matter. X-ray fluorescence is secondary X-rays excited when materials are bombarded with high-energy X-rays or gamma rays. This phenomenon is widely used in elemental analysis and chemical analysis, especially in the investigation and research of metals, glass, ceramics and building materials, geochemistry, forensic science, archaeology and artworks such as oil paintings and murals. [0003] X-ray fluorescence spectrometer, also known as XRF spectrometer, is divided into two types: dispersive type and non-dispersive type. The dispersion type is divided into wavelength dispersion type and energy dispersion type. The wavelength dispersive fluorescence spectrom...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/223G01N23/2209
CPCG01N23/223G01N23/2209
Inventor 张伟吴佰逊刘晓峰刘永睿陈树军尹兆余周洪军聂崧航于浩
Owner DANDONG DONGFANG MEASUREMENT&CONTROL TECHCO
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