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ESD detection circuit, integrated circuit and electronic equipment

A detection circuit and technology to be detected, applied in the field of circuits, can solve the problems of low sensitivity, difficult detection by ESD detection circuits, and high threshold thresholds, and achieve the effect of wide application

Pending Publication Date: 2022-01-28
SHENZHEN AIXIESHENG TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, there are following disadvantages in the related art: (1) the power supply / ground to be detected is the same set of power supply / ground as the ESD detection circuit itself, and the power supply / ground synchronously jitters (the amplitude and phase are almost the same) during the system-level ESD test, It makes it difficult for the ESD detection circuit to detect the jitter of its own power supply / ground; (2) From the analysis of the circuit structure, the detection threshold of this structure is relatively high, at least greater than the threshold voltage of the MOS tube, resulting in low sensitivity

Method used

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  • ESD detection circuit, integrated circuit and electronic equipment
  • ESD detection circuit, integrated circuit and electronic equipment
  • ESD detection circuit, integrated circuit and electronic equipment

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Embodiment Construction

[0030] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the embodiments of the present application will be described in detail below with reference to the accompanying drawings. However, those of ordinary skill in the art can understand that in each embodiment of the application, many technical details are provided for readers to better understand the application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical solutions claimed in this application can also be realized. The division of the following embodiments is for the convenience of description, and should not constitute any limitation to the specific implementation of the present application, and the embodiments can be combined and referred to each other on the premise of no contradiction.

[0031] An embodiment of the present application relates to an ESD detection c...

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Abstract

The invention relates to the field of circuits, in particular to an ESD detection circuit, an integrated circuit and electronic equipment. The ESD detection circuit provided by the embodiment comprises a coupling unit, a direct current bias unit and a phase inverter, wherein the first end of the coupling unit is connected with a to-be-detected end, the first end of the coupling unit is used for receiving a to-be-detected signal of the to-be-detected end, and the second end of the coupling unit is connected to the first end of the phase inverter; the first end of the direct-current bias unit is connected with a local grounding end, the second end of the direct-current bias unit is connected with a local power supply end, and the third end of the direct-current bias unit is connected with the first end of the phase inverter; and the second end of the phase inverter is connected with the local power supply end, the third end of the phase inverter is connected with the local grounding end, and the fourth end of the phase inverter is used for outputting a test signal. The detection threshold value of the ESD detection circuit can be set according to needs, the sensitivity of the ESD detection circuit can be manually adjusted, and the application range of the ESD detection circuit is wide.

Description

technical field [0001] The invention relates to the field of circuits, in particular to an ESD detection circuit, an integrated circuit and electronic equipment. Background technique [0002] In recent years, reliability issues of system-level electrostatic discharge (ESD, Electrostatic Discharge) events have received increasing attention in state-of-the-art circuits and systems. In order to achieve system-level ESD indicators, there are many effective methods reported and researched. Among them, the chip-level solution has been widely used in the integrated circuit industry due to almost no increase in cost. The chip-level solution is to design a dedicated ESD event ESD detection circuit to detect ESD events, and then the system performs the necessary Recovery operations such as chip reset, reloading of all configuration registers, etc. [0003] Such as Figure 1A , 1B Shown are the structures of two ESD detection circuits in the related art, Figure 1A The circuit struc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/001
Inventor 许建超孙添平戴贵荣陈世超戴庆田
Owner SHENZHEN AIXIESHENG TECH CO LTD