Electrical performance test method for solar cell and assembly
A technology for electrical performance testing and solar cells, which is applied in the monitoring of electrical components and photovoltaic systems, and measurement of electricity, can solve problems such as the inability to effectively and accurately test solar cells and components, and affect development, so as to reduce the test pulse width and reduce Application cost, effect suitable for promotion and application
Pending Publication Date: 2022-02-22
陕西众森电能科技有限公司 +1
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Problems solved by technology
With the trial production and promotion of HJT related products, the current long pulse width technology cannot effectively and accurately test this type of solar cells and modules, which affects the development of this technology
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[0022] The method for testing the electrical properties of solar cells and components of the present invention will be described in detail below with reference to the drawings and examples.
[0023] Such as figure 1 As shown, in the embodiment of the present disclosure, taking the I-V test mode as an example, the electronic load is initially in an open circuit state in the first part of the test method of this embodiment, as shown in figure 2 As shown, the state is delayed to ensure that the measured object is in the plateau, and then the corresponding electrical performance parameters are further collected; at this time, the voltage parameter collected by AD is the Voc of the measured object. The time setting of this part is t1 as 10ms. The time of this part is related to the hardware environment of the test in the specific test environment, and can be adjusted according to the actual situation.
[0024] After the end of the first part, enter the second part, the electroni...
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An electrical performance test method for a solar cell and an assemblybelongs to the field of solar cell module testing, and is characterized by comprising a first part: when an electronic load is in an open circuit state, data is acquired after time delay, and data Voc is acquired; and a second part: the electronic load is adjusted from an open circuit state to a short circuit state and then is gradually adjusted to the open circuit state, wherein in the process of the second part, the electronic load adjusting rate adopts nonlinear adjustment, and the electronic load adjusting frequency changes from high to low. The maximum power interval is accurately positioned through nonlinear driving of the electronic load, so that an accurate Pmax value is obtained in the test process, the test pulse width of a large capacitance effect test object can be effectively reduced, and the test pulse width can be equivalent to dozens of times to hundreds of times of a linear test mode; the large capacitance effect is tested based on the short pulse width, the core demands of terminal clients on the aspects of productivity rhythm, power consumption, equipment comprehensive use cost and the like can be effectively met, the application cost of an application end is reduced, and the method is suitable for popularization and application.
Description
technical field [0001] The invention belongs to the field of testing solar cell components, in particular to a method for testing electrical properties of solar cells and components. Background technique [0002] With the advancement of the photovoltaic industrialization process, the promotion and application of various high-efficiency cells and module technologies has gradually become the mainstream of the market. Currently, mass-produced PERC, N-type TOP Con and HJT in the promotion stage, the higher the cell efficiency, the more accurate the test. The difficulty gradually increases. Industrial sites often use longer pulse width test schemes to eliminate the difference caused by capacitive effects. Laboratories and third-party organizations often use multiple 10ms segmented tests to fit a complete IV curve. However, to obtain relatively accurate electrical performance using 10ms segments, it is necessary to set up dozens or even hundreds of segmented tests to meet the tes...
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Login to View More IPC IPC(8): G01R31/36H02S50/10
CPCG01R31/36Y02E10/50
Inventor 冯云峰王建平张丽贞刘皎张会文罗万里马文彬张鹤仙黄国保
Owner 陕西众森电能科技有限公司