Magnetron sputtering forming device for mechanical property test of mesoscale tensile sample
A technique of tensile specimen and magnetron sputtering, which is used in measuring devices, using stable tension/pressure to test the strength of materials, and preparation of samples for testing, etc. , to achieve the effect of clear outline and reduced impact
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Embodiment 1
[0035] Depend on figure 2 As shown, the mesoscale tensile sample 4 includes a dumbbell-shaped sample, which is provided with a clamping part 42 and a middle test part 41, and the clamping parts 42 of the dumbbell-shaped sample are at both ends, and in the middle of the dumbbell-shaped sample The surface of the test portion 41 is provided with a metal coating 8 by a magnetron sputtering method, and the metal coating 8 is used as a strain mark for the mechanical performance test of the tensile sample 4; the metal coating 8 is a micro-geometric circular structure distributed in an array, and each The diameters of the metal coatings 8 are on the order of microns, preferably distributed in a rectangular array.
[0036] Depend on figure 1 , Figure 3-Figure 5As shown, the present invention provides a magnetron sputtering forming device for testing the mechanical properties of mesoscale dumbbell-shaped samples, which is used for magnetron sputtering forming of the metal coating 8 ...
Embodiment 2
[0046] Depend on Figure 7 As shown, the mesoscale tensile sample 4 also includes a circular sample, which is provided with a clamping part 42 and an intermediate test part 41, the clamping part 42 of the circular sample is at its annular edge, and the circular sample The surface of the middle test portion 41 is provided with a metal coating 8 by a magnetron sputtering method, and the metal coating 8 is used as a strain mark for the mechanical performance test of the tensile sample 4; the metal coating 8 is a micro-geometric circular structure distributed in an array , the diameter of each metal coating 8 is in the order of microns, preferably distributed in a rectangular array.
[0047] Depend on Figure 6 , Figure 8-Figure 10 As shown, the present invention provides a magnetron sputtering forming device for testing the mechanical properties of mesoscale circular samples, which is used for the magnetron sputtering forming of the metal coating 8 of the intermediate test por...
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