Test calibration method of integrated circuit
A technology of integrated circuits and calibration methods, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve problems such as high complexity and cost, and difficulty in clock consistency, so as to reduce complexity and cost, and facilitate testing and parameter configuration , deliver accurate results
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[0015] The specific implementation of the method for testing and calibrating an integrated circuit according to the present invention will be described in detail below in conjunction with specific embodiments.
[0016] A method for testing and calibrating an integrated circuit according to the present invention, the steps of which are:
[0017] 1) First, the test equipment obtains the actual clock frequency of the integrated circuit to be tested by receiving the internal system clock of the integrated circuit to be tested;
[0018] 2) According to the measured actual clock frequency, the test equipment sends commands to the designated pins of the integrated circuit to be tested in a single-wire manner. After the transmission is completed, the test equipment enters the receiving state;
[0019] 3) The integrated circuit to be tested stores the command received from the specified pin in the shift register of the integrated circuit to be tested, and the last bit shifted into the ...
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