Voltage distribution analysis method based on read data

Abstract

The invention discloses a voltage distribution analysis method based on read data, which is applied to NAND Flash and comprises the following steps: determining the range of voltage to be measured according to a known standard voltage distribution diagram; determining a plurality of to-be-measured voltage shifts in the range of the to-be-measured voltage, wherein the to-be-measured voltage shifts refer to shifts of voltage threshold points used when original data in the NAND Flash is read; all the voltage threshold points are bound together for gear shifting, and original data in the NAND Flash are read and stored; calculating the relative number of storage states judged by each to-be-detected voltage gear corresponding to each voltage threshold point, and representing the relative number by CountX (i); and pre-drawing a voltage distribution diagram, and processing the CountX (i) based on the pre-drawn voltage distribution diagram to obtain a final voltage distribution diagram. According to the method, all voltage threshold points are bound and uniformly shifted and read, and the voltage distribution condition can be quickly obtained only based on read data, so that whether the state of the tested physical block is abnormal or not is judged.

Description

technical field [0001] The invention relates to the technical field of data storage, in particular to a voltage distribution analysis method based on read data. Background technique [0002] A solid-state drive (SSD), also known as a solid-state drive, is a hard disk made of solid-state electronic memory chip arrays. It usually consists of three major parts, namely the SSD main control chip, the flash memory particle array for storing data, and the cache chip. Compared with traditional mechanical hard drives, solid-state drives have the advantages of fast read and write speed, light weight, low energy consumption and small size, making them widely used in consumer markets, data centers and enterprise markets. [0003] The judgment voltage of NAND flash memory particles will directly affect the effectiveness of data storage. If testers can intuitively grasp the test results of voltage distribution, they can easily find out the best judgment voltage applicable to the current p...

AI Technical Summary

Problems solved by technology

However, in the development process of SSD solid state drive, when locating the problem disk, in most cases, it is not known what the original data in the current data disk is.

In this case, if you want to analyze whether the state of a certain physical block is normal through the voltage distribution curve, it is obviously difficult to meet this requirement using the existing NAND analysis method

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