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Space solar cell bypass diode testing device

A bypass diode and solar cell technology, which is applied in the direction of measuring device casing, single semiconductor device testing, etc., can solve the problems of non-spaced solar cell bypass diode test application, not satisfying forward pulse constant current, and using large equipment. Achieve the effect of less variety, low cost and simple circuit

Pending Publication Date: 2022-04-12
中电科蓝天科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to meet foreign standards such as Europe, it is necessary to test space solar cell bypass diodes according to foreign standards. Domestic space solar cell bypass diode development units do not have such testing equipment. Diodes are only subjected to forward constant current aging and reverse voltage tests, but the two tests are carried out independently and the equipment used is huge and expensive, and cannot be directly used for the test application of space solar cell bypass diodes
Ordinary signal generators can output positive and negative voltage waveforms, but the driving capacity is in the order of milliamps, which does not meet the requirements of positive pulse constant current and several amperes.

Method used

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  • Space solar cell bypass diode testing device
  • Space solar cell bypass diode testing device
  • Space solar cell bypass diode testing device

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Embodiment Construction

[0028] In order to further understand the invention content, characteristics and effects of the present invention, the following examples are cited hereby, and are described in detail as follows in conjunction with the accompanying drawings: the following examples are only descriptive, not limiting, and cannot limit the protection of the present invention with this scope.

[0029] Components such as resistors, diodes, and power tubes listed in the circuit diagram of the present invention can also be combined networks of equivalent resistors, diodes, and power tubes, but the circuit diagram of the present invention is the most concise.

[0030] Such as Figure 1 to Figure 4 Shown, technical scheme of the present invention is:

[0031] A space solar cell bypass diode testing device, comprising:

[0032] waveform generator;

[0033] Power topology circuit, applying forward pulse constant current source I to the solar cell bypass diode in the measured space FW , reverse voltag...

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Abstract

The invention discloses a space solar cell bypass diode testing device, and belongs to the technical field of space power supplies. The power topology circuit applies a forward pulse constant current source, a backward voltage and a test waveform which is continuous in forward and backward voltage power waveform and meets the standard condition pulse width time to the solar cell bypass diode in the tested space; the logic control circuit receives a signal generated by the pulse width generation circuit with the reference potential from 0 potential to positive potential and variable pulse width time, and drives the power topology circuit through logic control formed by a transistor and a peripheral resistor so as to realize a power waveform required by a solar cell bypass diode test; removing a damping network; and the power topology circuit is connected with the waveform generator through the logic control circuit and the de-damping network. The ECSS standard test waveform is met, the pulse width time value is adjustable, the forward pulse constant current amplitude is adjustable, the backward voltage value is adjustable, and the forward and reverse voltage transition stage is continuous.

Description

technical field [0001] The invention belongs to the technical field of space power supplies, and in particular relates to a space solar battery bypass diode testing device. Background technique [0002] At present, space vehicles and satellite power systems generally use solar cell arrays as power generation units. There are many types of solar cells, including single-junction cells, triple-junction cells, and multi-cell cells. The materials include silicon cells, gallium arsenide cells, etc. Different types of cells are equipped with The bypass diode specifications will be different, resulting in the forward current I of the space solar cell bypass diode FW and reverse withstand voltage V REV Values ​​and other test conditions are different. In order to improve the reliability of bypass diodes for space solar cells, the European Space Standards Cooperation (ECSS) has formulated the assessment standards for bypass diodes for space solar cells, as shown in the attached fig...

Claims

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Application Information

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IPC IPC(8): G01R31/26G01R1/04
Inventor 张伟程保义王锴李建平栾伯英李爽
Owner 中电科蓝天科技股份有限公司