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Machine for aging test of semiconductor device

A device aging and semiconductor technology, which is applied in the direction of single semiconductor device testing, etc., can solve problems such as the problem of lifting platform operation, and achieve the effects of improving production efficiency, saving time and labor, and reducing labor intensity of workers

Pending Publication Date: 2022-04-15
SUZHOU XINHUARUI ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The object of the present invention is to provide a machine platform for aging testing of semiconductor devices to solve the problem of the operation of the lifting platform

Method used

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  • Machine for aging test of semiconductor device
  • Machine for aging test of semiconductor device
  • Machine for aging test of semiconductor device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0038] see figure 1 , this embodiment is further described for other embodiments, a machine for aging testing of semiconductor devices, including a base 1, a rotating seat 11 is fixed on the base 1, a turntable 12 is installed in the rotating seat 11, and a turntable 12 is fixed There is a threaded rod 13, a threaded cylinder 14 is arranged on the threaded rod 13, a table 15 is fixed on the threaded cylinder 14, a limit cylinder 18 is fixed on the table 15, and a limit rod fixed to the base 1 is provided on the sliding sleeve of the limit cylinder 18 19. A storage base 16 is fixed on the table 15, and a semiconductor body 17 is placed on the storage base 16.

[0039] see figure 1 A motor 2 is fixed on the base 1, a driving pulley 21 is fixed on the rotating shaft of the motor 2, and the motor 2 is a servo motor, which can cooperate with the processor 54 to set rotation parameters and opening and closing.

[0040] see figure 1 The threaded rod 13 is fixedly sleeved with a li...

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PUM

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Abstract

The invention discloses a machine table for an aging test of a semiconductor device, and the machine table comprises a pedestal, a rotating seat is fixed on the pedestal, a rotating disc is rotatably installed in the rotating seat, a threaded rod is fixed on the rotating disc, a threaded cylinder is arranged on the threaded rod, a table top is fixed on the threaded cylinder, and a limiting cylinder is fixed on the table top. A limiting rod fixed to the base is slidably arranged in the limiting cylinder in a sleeved mode, an object placing base is fixed to the table top, and a semiconductor body is placed on the object placing base. By setting and controlling a panel matched with the processor, materials can ascend and descend stably, the lifting height is controlled through a sensor, manual operation is not needed, the labor intensity of workers is reduced, time and labor are saved, the production efficiency is greatly improved, different materials can be compatible by replacing fork feet, and the production efficiency is improved. And the universality of various product conditions is realized.

Description

technical field [0001] The invention relates to the technical field of aging testing of semiconductor devices, in particular to a machine for aging testing of semiconductor devices. Background technique [0002] With the rapid development of the semiconductor industry, domestic semiconductor devices are gradually upgraded from low-end to mid-to-high end. In aerospace, industrial control, automobile, medical and other fields, the high-quality and high-reliability requirements of semiconductor devices need to be used in batches. Production of semiconductor aging test equipment. [0003] The aging detection of semiconductors mainly conducts environmental simulation through constant temperature and humidity chambers, aging and destroying semiconductors, and then conducts contact tests with electrical equipment such as multimeters to obtain data, and then compares them with normal data to obtain aging information. [0004] During the test, the aging semiconductor is mainly place...

Claims

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Application Information

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IPC IPC(8): G01R31/26
Inventor 陈冬兵
Owner SUZHOU XINHUARUI ELECTRONICS