A method, device, computer storage medium and terminal for realizing chip detection

Abstract

This paper discloses a method, device, computer storage medium, and terminal for realizing chip detection, including: for each first logical computing unit (ALU) of a proof-of-work (PoW) chip under static test, obtaining the first ALU read The first data fetched, the first data is read from the first storage block according to the preset memory address; according to the correctness rate of the determined first ALU data read, the first ALU used for the proof-of-work operation is determined; wherein, The first ALU is any ALU in the PoW chip to be detected; the memory address includes: a preset number of addresses determined according to the distribution of address lines and / or data lines for transmitting data. The embodiment of the present invention judges whether the first ALU is used for the proof-of-work calculation by reading the data of the preset memory address, which reduces the detection time of the PoW chip; The current functional unit of the chip is affected.

Description

technical field [0001] This article relates to but is not limited to chip detection technology, especially a method, device, computer storage medium and terminal for realizing chip detection. Background technique [0002] The proof-of-work (PoW) algorithm generally requires large-capacity memory and a large number of channels, so PoW chips often have the following characteristics: 1) integrate more computing units (ALU); 2) integrate more storage control units; 3) integrate all Connect the control unit. The more functional units a PoW chip integrates, the more functional units may have problems during the chip production process, that is, chip differences. [0003] Usually the detection methods of the proof-of-work chip are: 1) Design for Testability (DFT), DFT can quickly detect whether the wiring inside the chip is connected correctly, but does not detect whether the function of the chip is normal; 2) By designing a functional test script The program tests each functiona...

AI Technical Summary

Problems solved by technology

The more functional units the PoW chip integrates, the more problems may occur in some functional units during the chip production process, that is, the chip difference

[0003] Usually, the detection methods of proof-of-work chips are: 1) Design for Testability (DFT), DFT can quickly detect whether the internal wiring of the chip is connected correctly, but it does not detect whether the function of the chip is normal; 2) Design a functional test script The program tests each functional unit, and if it is determined that the functional unit fails, the failed functional unit is marked; due to the mutual influence of the functional units in the chip, when a functional unit fails, a single test cannot judge Whether the functional unit fails or is caused by the failure of other functional units, it is necessary to test each functional unit as much as possible, so there is a problem of long test time; in addition, the above method cannot detect the chip in use in real time. When a newly failed functional unit occurs during use, the failed functional unit cannot be determined

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