Lightning surge testing device

Abstract

The invention relates to a lightning stroke surge test device, which is used for carrying out lightning stroke surge test on equipment to be tested and comprises a CPU (Central Processing Unit) master controller, a high-voltage module, an action main switch module, a waveform generation module, a waveform acquisition module, an input device, a display device, a storage device and an alarm device, the waveform generation module is connected with a to-be-tested device and applies surge pulses to the to-be-tested device, and the waveform acquisition module is connected with the to-be-tested device and acquires waveform data of the surge pulses before and after entering the to-be-tested device. Compared with the prior art, the surge pulse waveform data before entering the to-be-tested equipment and the surge pulse waveform data after passing through the to-be-tested equipment are acquired through the waveform acquisition module, so that the failure process of the to-be-tested equipment in the test process can be analyzed, and the abnormality in the test process can be judged and analyzed; the high-voltage module, the action main switch module and the waveform acquisition module are improved, and the performance of the lightning surge testing device is improved.

Description

technical field [0001] The invention relates to the field of lightning surge testing, in particular to a lightning surge testing device. Background technique [0002] With the advancement of society and technology, people pay more and more attention to safety and product stability when using electronic equipment. However, electronic equipment will generate surges due to equipment switching, electrostatic discharge, circuit failure, lightning strikes, etc., which will cause certain damage to electronic equipment. Among them, lightning strikes are the most destructive to electronic equipment. Therefore, test the anti-lightning surge capability of electronic equipment. is an important factor in evaluating its product performance. However, in the existing lightning surge test projects for electronic products, only the test results are often given, and the changes of the surge pulse during the test cannot be monitored, and the impact of different surge pulses on electronic produ...

AI Technical Summary

Problems solved by technology

However, in the existing lightning surge test items for electronic products, only the test results are often given, and the changes of the surge pulses during the test cannot be monitored, so it is impossible to know the impact of different surge pulses on electronic products. When the test equipment has abnormal conditions such as short circuit and open circuit during the test, it is impossible to know the specific situation

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