Automatic batch testing device for chip capacitors and use method

A technology of batch testing and capacitors, which is applied in the direction of measuring devices, measuring device casings, and components of electrical measuring instruments, etc., can solve problems such as difficulty in satisfying automated testing, high detection capabilities, high operating requirements, and low detection efficiency, and achieve testing The results are effective and reliable, the accuracy is guaranteed, and the effect of easy loading, unloading, maintenance and replacement

Pending Publication Date: 2022-06-28
GUIZHOU AEROSPACE INST OF MEASURING & TESTING TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the detection of relevant parameters of chip capacitors is still carried out manually by clamping capacitors one by one. Due to the large amount of detection, it is not only ...

Method used

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  • Automatic batch testing device for chip capacitors and use method
  • Automatic batch testing device for chip capacitors and use method
  • Automatic batch testing device for chip capacitors and use method

Examples

Experimental program
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Effect test

Embodiment 1

[0033] like Figure 1-5 As shown, an automatic batch testing device for chip capacitors includes a console 1, a testing instrument 2, a test terminal 3 and a computer 4, and the console 1 is provided with a slide rail 5 longitudinally in the middle of the table top, and the slide rail 1 The upper part of the 5 is provided with a sliding rail 2 7 horizontally through the bracket 6, the sliding rail 2 7 is perpendicular to the sliding rail 1 5, and the sliding rail 1 5 is slidably connected to the tray 8 for placing the capacitor test board 9. Several test stations are arranged in a matrix for placing the capacitors to be tested. The slide rail 2 7 is slidably connected to the slider 10. The slider 10 is provided with a slide rail 3 11 on the outer side. The slide rail 3 11 is slidably connected to the test end 3. The test end 3 is connected to the test instrument 2 and the test instrument 2 through wires. Electrically connected to the computer 4; the tray 8, the slider 10 and ...

Embodiment 2

[0041] A method for using an automatic batch testing device for chip capacitors, comprising the following processes:

[0042] S1: Set the palletizing statement through the computer software, and set the number of rows and columns of the test station matrix;

[0043] S2: Set the number of stacking strokes, and specify the priority axis for stacking;

[0044] S3: Set the stacking starting point and stacking spacing, formulate the arch trigger position, and prepare for operation;

[0045] S4: Run the test contact to reach the starting point of the stacking and send the in-position signal to start the test;

[0046] S5: Run the stacking point according to the stacking setting and complete the test.

[0047] Preferably, when the test data is zero or exceeds the set threshold range, each slide rail on the console executes a reset operation command to stop the test and return to the original position.

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Abstract

The invention discloses an automatic batch test device for chip capacitors and a use method, the device comprises a console, the middle part of the console surface is longitudinally provided with a slide rail I, a slide rail II is transversely arranged above the slide rail I, the slide rail I is in sliding connection with a tray for placing a capacitor test board, and the slide rail II is in sliding connection with a slide block. A third sliding rail is arranged on the outer side of the sliding block and slidably connected with a testing end, the testing end is connected with a testing instrument through a wire, and the testing instrument is electrically connected with a computer. The tray, the sliding block and the test end are respectively driven by a motor to move longitudinally, transversely and vertically, and the motor is connected with a computer. During use, a stacking declaration is set through a computer, an arch-shaped triggering position is formulated, a test contact is operated to reach a stacking starting point and sends an in-place signal, test is started, and the test is completed by running a stacking point according to stacking setting. According to the invention, the detection efficiency of the small-size chip capacitor is improved, and automatic and batch testing of the chip capacitor is realized.

Description

technical field [0001] The invention belongs to the technical field of capacitor testing, and in particular relates to an automatic batch testing device for chip capacitors and a using method. Background technique [0002] With the rapid development of electronic science and technology, the production of capacitors is becoming more and more precise, and the size is getting smaller and smaller. At present, the detection of relevant parameters of chip capacitors is still carried out by manually clamping the capacitors piece by piece. Due to the large amount of detection, it is not only time-consuming and laborious, has high operational requirements, but also has low detection efficiency, which is difficult to meet the needs of automated testing and high detection capabilities. Therefore, there is an urgent need to research an automatic batch testing device for chip capacitors, to realize automatic, batch and fast testing of relevant parameters of capacitors, and to improve pro...

Claims

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Application Information

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IPC IPC(8): G01R31/01G01R1/04
CPCG01R31/016G01R1/0416
Inventor 王伟伟杨玉龙吕翔孙毅王文玺赵中泽
Owner GUIZHOU AEROSPACE INST OF MEASURING & TESTING TECH
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