Flight test data missing value filling method based on wavelet denoising optimization
A flight test and wavelet denoising technology, applied in the field of data processing, can solve the problem of low filling accuracy of missing values in flight test data, and achieve the effect of improving wavelet denoising accuracy, ensuring integrity, and improving filling accuracy.
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[0025] The present invention will be described in further detail below with reference to the accompanying drawings and specific embodiments. It should be noted that the present invention complies with the provisions of Article 2, Item 2 of the Patent Law, and at the same time does not belong to the non-granting of patents stipulated in Article 25 of the Patent Law. subject of rights.
[0026] refer to figure 1 , the present invention comprises the steps:
[0027] Step 1, perform linear regression filling on the flight test data f(n) with missing values:
[0028] Step 1a) Initialize the time series value n that contains Q missing data in the unprocessed flight test data f(n) of length N m ={n m (1),n m (2),...,n m (q),...,n m (Q)} and the time-series values n for the K nonmissing data o ={n o (1),n o (2),...,n o (k),...,n o (K)}, and construct each missing data time series value n m (q) The nearest L non-missing data time series values around x=[n o (k),n o (k...
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