Circuit and method for reducing power consumption of high-voltage testing machine

Abstract

The invention discloses a circuit and method for reducing power consumption of a high-voltage testing machine, and the circuit comprises a high-voltage voltage source unit, a current control switch unit, and a control circuit unit, the high-voltage voltage source unit comprises n DC voltage source modules, (n-1) diodes, and (n-1) resistors, the current control switch unit comprises (n-1) current control switches, the control circuit unit controls the working state of each power tube according to the required measurement condition, and controls the actual output state of each DC voltage source through the working state of each power tube, so as to meet the electrical parameters required by the test of the tested device. On the premise of keeping the actual maximum output voltage unchanged, n DC voltage source modules are connected in series to obtain a high-voltage voltage source, and the actual output state of each DC voltage source module connected in series is independently controlled by a current control switch in a current control switch unit. The power consumption can be reduced, and the loop efficiency can be improved.

Description

technical field [0001] The invention relates to a circuit and a method for reducing power consumption of a high-voltage testing machine, belonging to the technical field of semiconductor high-voltage testing. Background technique [0002] At present, the common high-voltage test circuits of discrete testers on the market generally use such as figure 1 The linear circuit shown, the circuit uses an independent high-voltage power supply V1 to provide the voltage required for semiconductor testing. In order to make the testing machine compatible with different types and types of semiconductor device testing, the output voltage of the high-voltage DC power supply V1 can often reach hundreds of volts. even thousands of volts. This circuit can achieve high efficiency when measuring high voltage semiconductor devices. However, most semiconductor devices on the market generally only need to provide test voltage conditions of tens or even hundreds of volts during testing. Using this...

AI Technical Summary

Problems solved by technology

[0005] Purpose of the invention: Since the output of the high-voltage test circuit of the traditional testing machine can only be provided by a single power supply and cannot be adjusted, for the overall circuit, when performing non-high-voltage semiconductor tests such as low voltage, the power tube has excessive power consumption and serious heating. The problem of easy damage, and the overall efficiency of the test circuit is relatively low. The present invention provides a circuit and method for reducing the power consumption of the high-voltage testing machine, which uses a combination of multiple current control switches and DC power supplies, and monitors the output status of the upper voltage source through the current control switch. Realize the self-excited control of the total output voltage, so that the output voltage is as close as possible to the actual required test electrical parameters, so as to achieve the purpose of reducing power consumption and improving loop efficiency

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