Multi-wavelength target emissivity distribution characteristic measuring device based on transmission-type light path
A technology of distribution characteristics and measurement devices, which is applied in the field of multi-wavelength target emissivity distribution characteristics measurement devices, can solve problems such as insufficient attention to the design of the exit laser optical path, different laser projection optical paths, and measurement results that deviate from ideal conditions, etc., to achieve high stability The effect of sexual emissivity distribution measurements
Active Publication Date: 2022-08-09
NAT INST OF METROLOGY CHINA
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Problems solved by technology
However, since the laser has a certain divergence angle, this method does not pay enough attention to the optical path design of the outgoing laser.
Therefore, if the target to be measured is not a flat piece, when the emissivity distribution measurement is carried out at different positions, the laser projection optical path is different, resulting in a gap in the projected spot size, which will cause the measurement result to deviate from the ideal condition
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[0030] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, but not to be construed as a limitation of the present invention.
[0031] It will be understood by those skilled in the art that the singular forms "a", "an", "the" and "the" as used herein can include the plural forms as well, unless expressly stated otherwise. It should be further understood that the word "comprising" used in the description of the present invention refers to the presence of stated features, integers, steps, operations, elements and / or components, but does not preclude the presence or addition of one or more other features, Integers, step...
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Abstract
The invention relates to a multi-wavelength target emissivity distribution characteristic measuring device based on a transmission-type light path, and the device comprises a first laser generator which is used for generating a first wavelength laser beam; the second laser generator is used for generating a second wavelength laser beam; the third laser generator is used for generating a third wavelength laser beam; the first beam splitter is used for coupling the first wavelength laser beam and the second wavelength laser beam; the second beam splitter is used for ensuring that the ranging laser and the modulated laser with the first wavelength, the second wavelength and the third wavelength are coaxial; the laser output from the third beam splitter enters a laser incident end; the laser incident end is used for adjusting the spatial position of laser input; the laser incident end is connected to the integrating sphere through a screw stepping hollow motor. When the device is used for carrying out emission distribution measurement on a to-be-measured sample piece with a three-dimensional structure, projection optical paths at different positions can be ensured to be the same; the multi-wavelength coaxial design enables the device to carry out emissivity distribution measurement under different wavelengths.
Description
technical field [0001] The invention belongs to the technical field of radiation characteristic measurement, and in particular relates to a multi-wavelength target emissivity distribution characteristic measurement device based on a transmissive optical path. Background technique [0002] In recent years, the research on the distribution characteristics of target emissivity has gradually received attention in the field of radiation characteristics. For some large-sized targets to be measured, when carrying out emissivity measurement, in addition to their overall emissivity characteristics, people often pay more attention to their emissivity distribution characteristics at different spatial positions, so as to understand their macroscopic radiation from different dimensions. characteristics; especially for large-scale blackbody surface sources, the related field also pays great attention to the emissivity values at different positions. [0003] Among the existing measureme...
Claims
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Login to View More IPC IPC(8): G01J5/00G01N21/3563G01N21/39
CPCG01J5/0003G01N21/3563G01N21/39
Inventor 安保林董伟祝晓轶卢小丰赵云龙原遵东
Owner NAT INST OF METROLOGY CHINA