Porous insulating material and method for making same
A technology of porous and sacrificial materials, which is applied in the manufacture of semiconductor/solid-state devices, coatings, circuits, etc., and can solve the problem that the dielectric constant of objects cannot be satisfied
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Embodiment 1
[0096] The method for preparing a mixture of 20% triethoxysilyl norbornene polymer (Mw=158000, determined in monochlorobenzene by GPC method) and 80% MSQ (Accuspin T-18) (by weight) is The above two components were respectively dissolved in an appropriate amount of 4-methyl-pentanone, and then the two solutions were mixed under stirring. The resulting solution was stirred at room temperature for 1 hour to obtain a sacrificial material / dielectric material composition. The resulting composition was then spin-coated on a metallized silicon substrate to obtain a dielectric layer with a thickness of approximately 620 nm. Thereafter, the coated metallized silicon substrate is inspected by an optical microscope, and it is confirmed that there are no defects in the sacrificial material / dielectric material composition layer and there are no pinholes and through holes.
[0097] Then, the metallized silicon substrate coated with the sacrificial material / dielectric material composition w...
Embodiment 2
[0104] The metallized silicon substrate of Example 2 was prepared in the same manner as described above in Example 1, except that the dielectric layer was composed of 20% triethoxysilyl norbornene polymer and 80% Accuglass 512 production. The final curing temperature for Example 2 was about 400°C. The average dielectric constant of the dielectric layer of this embodiment was measured and found to be 2.71 with a standard deviation of 0.05.
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Abstract
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